Patents by Inventor Jason T. Albert
Jason T. Albert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11181549Abstract: A method of probing printed circuit boards that includes providing a circuit board design including a plurality of probe points, and selecting a probe point including a location ink from the plurality of probe points in the circuit board design to be probed on a physical printed circuit board design. The method continues with probing at least one probe point of the plurality of probe points with a probe that activates the location ink. Activation of the location ink by the probe indicates the selected probe point including the locating ink.Type: GrantFiled: June 7, 2019Date of Patent: November 23, 2021Assignee: International Business Machines CorporationInventors: Jason T. Albert, Matthew S. Doyle, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light
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Publication number: 20200134542Abstract: A method, system and computer program product are provided for implementing enhanced prioritized order scoring based upon user location and user history. A prioritized order score used for work prioritization is calculated using user location and user history. A respective prioritized order score is identified for an ordered pickup location and an alternative pickup location. The identified prioritized order scores are compared to identify a location for the order.Type: ApplicationFiled: October 26, 2018Publication date: April 30, 2020Inventors: Jason T. Albert, Matt K. Light, Matthew J. Scheckel, Kahn C. Evans, Steven B. Janssen
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Publication number: 20190285665Abstract: A method of probing printed circuit boards that includes providing a circuit board design including a plurality of probe points, and selecting a probe point including a location ink from the plurality of probe points in the circuit board design to be probed on a physical printed circuit board design. The method continues with probing at least one probe point of the plurality of probe points with a probe that activates the location ink. Activation of the location ink by the probe indicates the selected probe point including the locating ink.Type: ApplicationFiled: June 7, 2019Publication date: September 19, 2019Inventors: Jason T. Albert, Matthew S. Doyle, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light
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Patent number: 10371718Abstract: A method of probing printed circuit boards that includes providing a circuit board design including a plurality of probe points, and selecting a probe point including a location ink from the plurality of probe points in the circuit board design to be probed on a physical printed circuit board design. The method continues with probing at least one probe point of the plurality of probe points with a probe that activates the location ink. Activation of the location ink by the probe indicates the selected probe point including the locating ink.Type: GrantFiled: November 14, 2016Date of Patent: August 6, 2019Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Jason T. Albert, Matthew S. Doyle, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light
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Publication number: 20180136255Abstract: A method of probing printed circuit boards that includes providing a circuit board design including a plurality of probe points, and selecting a probe point including a location ink from the plurality of probe points in the circuit board design to be probed on a physical printed circuit board design. The method continues with probing at least one probe point of the plurality of probe points with a probe that activates the location ink. Activation of the location ink by the probe indicates the selected probe point including the locating ink.Type: ApplicationFiled: November 14, 2016Publication date: May 17, 2018Inventors: Jason T. Albert, Matthew S. Doyle, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light
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Publication number: 20170212872Abstract: A server prevents duplicate posts within a question and answer forum. The server may compare the user question vector to each of the plurality of corpus question vectors to determine the closest match between the user question vector and the corpus question vectors to obtain an identified question and answer row, and determine if the identified Q and A row has a last answer that has a corresponding confidence to the question of the identified Q and A row that exceeds a confidence threshold. Responsive to a positive determination, the server may determine if the user question is similar to a question in the identified Q and A row, and if so the server may determine that the last answer is similar to any answer in the identified Q and A row that is not the last answer, and in response, block the submission of the user question.Type: ApplicationFiled: January 22, 2016Publication date: July 27, 2017Inventors: Jason T. Albert, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light, David R. Nickel, Karl M. Solie, Michael L. Trantow
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Publication number: 20170212916Abstract: A method prevents duplicate posts within a question and answer forum. The method may compare the user question vector to each of the plurality of corpus question vectors to determine the closest match between the user question vector and the corpus question vectors to obtain an identified question and answer row, and determine if the identified Q and A row has a last answer that has a corresponding confidence to the question of the identified Q and A row that exceeds a confidence threshold. Responsive to a positive determination, the method may determine if the user question is similar to a question in the identified Q and A row, and if so the server may determine that the last answer is similar to any answer in the identified Q and A row that is not the last answer, and in response, block the submission of the user question.Type: ApplicationFiled: March 21, 2016Publication date: July 27, 2017Inventors: Jason T. Albert, Christopher J. Engel, Kahn C. Evans, Steven B. Janssen, Matt K. Light, David R. Nickel, Karl M. Solie, Michael L. Trantow
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Patent number: 8429619Abstract: An executable high-level trace file generation system provides reduced debugging effort and time, particularly on initial startup of new or modified hardware. An executable program invokes high-level application programming interfaces (APIs), to perform various tasks. Instructions within the APIs generate a trace file documenting the invoked sequence of APIs by writing a line to a trace file that documents the API and input parameters received by the API. Upon completion of execution of the API, the return value may be documented as a comment line in the trace file. The resulting trace file is then re-executable as a script and may be edited to alter the sequence of APIs invoked and/or the arguments provided. The script interpreter may be a command line interface through which the APIs are invoked, and trace files may be similarly generated that document sequences of manually entered commands.Type: GrantFiled: July 3, 2007Date of Patent: April 23, 2013Assignee: International Business Machines CorporationInventors: Jason T. Albert, Christopher J. Engel, John Farrugia, Paul G. Van Leeuwen, Brent M. Wieman
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Patent number: 8327340Abstract: An executable high-level trace file generation method provides reduced debugging effort and time, particularly on initial startup of new or modified hardware. An executable program invokes high-level application programming interfaces (APIs), to perform various tasks. Instructions within the APIs generate a trace file documenting the invoked sequence of APIs by writing a line to a trace file that documents the API and input parameters received by the API. Upon completion of execution of the API, the return value may be documented as a comment line in the trace file. The resulting trace file is then re-executable as a script and may be edited to alter the sequence of APIs invoked and/or the arguments provided. The script interpreter may be a command line interface through which the APIs are invoked, and trace files may be similarly generated that document sequences of manually entered commands.Type: GrantFiled: March 29, 2012Date of Patent: December 4, 2012Assignee: International Business Machines CorporationInventors: Jason T. Albert, Christopher J. Engel, John Farrugia, Paul G. Van Leeuwen, Brent M. Wieman
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Publication number: 20120185831Abstract: An executable high-level trace file generation method provides reduced debugging effort and time, particularly on initial startup of new or modified hardware. An executable program invokes high-level application programming interfaces (APIs), to perform various tasks. Instructions within the APIs generate a trace file documenting the invoked sequence of APIs by writing a line to a trace file that documents the API and input parameters received by the API. Upon completion of execution of the API, the return value may be documented as a comment line in the trace file. The resulting trace file is then re-executable as a script and may be edited to alter the sequence of APIs invoked and/or the arguments provided. The script interpreter may be a command line interface through which the APIs are invoked, and trace files may be similarly generated that document sequences of manually entered commands.Type: ApplicationFiled: March 29, 2012Publication date: July 19, 2012Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Jason T. Albert, Christopher J. Engel, John Farrugia, Paul G. Van Leeuwen, Brent M. Wieman
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Patent number: 7514947Abstract: A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.Type: GrantFiled: August 31, 2007Date of Patent: April 7, 2009Assignee: International Business Machines CorporationInventors: Jason T. Albert, William T. Bronk, Timothy J. Eby, Michael J. Hamilton, Norman K. James
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Publication number: 20090058450Abstract: A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.Type: ApplicationFiled: August 31, 2007Publication date: March 5, 2009Inventors: Jason T. Albert, William T. Bronk, Timothy J. Eby, Michael J. Hamilton, Norman K. James
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Publication number: 20090013312Abstract: An executable high-level trace file generation system and method provide reduced debugging effort and time, particularly on initial startup of new or modified hardware. An executable program invokes high-level application programming interfaces (APIs), to perform various tasks. Instructions within the APIs generate a trace file documenting the invoked sequence of APIs by writing a line to a trace file that documents the API and input parameters received by the API. Upon completion of execution of the API, the return value may be documented as a comment line in the trace file. The resulting trace file is then re-executable as a script and may be edited to alter the sequence of APIs invoked and/or the arguments provided. The script interpreter may be a command line interface through which the APIs are invoked, and trace files may be similarly generated that document sequences of manually entered commands.Type: ApplicationFiled: July 3, 2007Publication date: January 8, 2009Inventors: Jason T. Albert, Christopher J. Engel, John Farrugia, Paul G. Van Leeuwen, Brent M. Wieman