Patents by Inventor Jason T. Nguyen

Jason T. Nguyen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Directed fluidics
    Patent number: 11937779
    Abstract: Methods and systems for administering directed fluidics during a medical procedure for removing an object are disclosed. A method includes inserting first and second medical instruments into a treatment site, providing irrigation and aspiration of the treatment site through the first and second medical instruments, determining a characteristic of one of the irrigation and the aspiration, and selecting a characteristic of the other of the irrigation and aspiration based on the determined characteristic.
    Type: Grant
    Filed: November 24, 2020
    Date of Patent: March 26, 2024
    Assignee: Auris Health, Inc.
    Inventors: Jason Joseph Hsu, Ka Chun Wong, Rachel Leigh Chok, Joshua F. DeFonzo, Binh T. Nguyen, Vivian Thalia Nguyen, Rishi Nikhil Purohit, Joseph A. Urban, Jr.
  • Method for testing jitter tolerance of high speed receivers
    Patent number: 7080292
    Abstract: A method and apparatus is presented for measuring jitter tolerance in a device under test. A device under test is established to operate at a specific frequency. A bit pattern is generated from a bit pattern generator. The bit pattern generated by the bit pattern generator is produced at a frequency that is a multiple of the frequency that the device under test is operating under. Bits are systematically changed in the bit pattern and then errors are measured in the device under test. As a results the jitter tolerance of the device under test is measured.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: July 18, 2006
    Inventors: Charles E. Moore, Aaron M. Volz, Suzette D. Vandivier, Jason T. Nguyen
  • Method for testing jitter tolerance of high speed receivers
    Publication number: 20040205431
    Abstract: A method and apparatus is presented for measuring jitter tolerance in a device under test. A device under test is established to operate at a specific frequency. A bit pattern is generated from a bit pattern generator. The bit pattern generated by the bit pattern generator is produced at a frequency that is a multiple of the frequency that the device under test is operating under. Bits are systematically changed in the bit pattern and then errors are measured in the device under test. As a results the jitter tolerance of the device under test is measured.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 14, 2004
    Inventors: Charles E. Moore, Aaron M. Volz, Suzette D. Vandivier, Jason T. Nguyen