Patents by Inventor Jason Yip Jee Too

Jason Yip Jee Too has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12272136
    Abstract: In one aspect, an agricultural method for monitoring surface conditions for an agricultural field includes receiving, with a computing system, an image of an imaged portion of an agricultural field, with the imaged portion of the agricultural field being represented by a plurality of pixels within the image. The method also includes identifying, with the computing system, at least one pixel-related parameter associated with the plurality of pixels within the image, determining, with the computing system, whether at least one image quality metric for the image is satisfied based at least in part on the at least one pixel-related parameter, and estimating, with the computing system, a surface condition associated with the agricultural field based at least in part on the image when it is determined that the at least one image quality metric is satisfied.
    Type: Grant
    Filed: April 30, 2021
    Date of Patent: April 8, 2025
    Assignee: CNH Industrial America LLC
    Inventors: Christopher Nicholas Warwick, Jason Yip Jee Too
  • Publication number: 20220350989
    Abstract: In one aspect, an agricultural method for monitoring surface conditions for an agricultural field includes receiving, with a computing system, an image of an imaged portion of an agricultural field, with the imaged portion of the agricultural field being represented by a plurality of pixels within the image. The method also includes identifying, with the computing system, at least one pixel-related parameter associated with the plurality of pixels within the image, determining, with the computing system, whether at least one image quality metric for the image is satisfied based at least in part on the at least one pixel-related parameter, and estimating, with the computing system, a surface condition associated with the agricultural field based at least in part on the image when it is determined that the at least one image quality metric is satisfied.
    Type: Application
    Filed: April 30, 2021
    Publication date: November 3, 2022
    Inventors: Christopher Nicholas Warwick, Jason Yip Jee Too