Abstract: Systems and methods herein are for hose management in a computing module. A rotatable support structure includes a moveable inset structure and is to support rotation movement of cooling hoses that are to cool underlying devices in the computing module, where the rotation movement is about an axis of the computing module to allow the cooling hoses to be moved away from the underlying devices of the computing module and where the movable inset structure is movable within the rotatable support structure to receive tension on the cooling hoses from being coupled to a manifold of the computing module.

Abstract: According to an aspect, there is provided an electrical socket system comprising: an electrical socket comprising at least one temperature sensor; and a controller configured to monitor a temperature sensed by the temperature sensor, wherein the controller is configured to: determine a temperature gradient of the temperature with respect to time; determine if the temperature gradient exceeds a threshold gradient value; and trigger an alarm event if it is determined that the temperature gradient exceeds the threshold gradient value.

Abstract: According to an aspect, there is provided an electrical socket system comprising: an electrical socket comprising at least one temperature sensor; and a controller configured to monitor a temperature sensed by the temperature sensor, wherein the controller is configured to: determine a temperature gradient of the temperature with respect to time; determine if the temperature gradient exceeds a threshold gradient value; and trigger an alarm event if it is determined that the temperature gradient exceeds the threshold gradient value.

Abstract: A platform and method for testing antibiotic sensitivity of a polymicrobial infection is provided. The platform includes a body defining a plurality of sets of chambers and a plurality of wells. Each set of chambers has a plurality of chambers adapted for culturing microbes of the polymicrobial infection therein. Each well is associated with a corresponding set of chambers and has an input in fluidic communication with the outlets of the plurality of chambers in the corresponding set of chambers. Selected antibiotic therapies may be received in the wells which fluidically connect the plurality of chambers in a corresponding set of chambers such that microbes cultured in the plurality of chambers in the corresponding set of chambers are in soluble factor contact.

Abstract: A method for forming a semiconductor arrangement is provided. The method includes forming a patterned photoresist over a top surface of a substrate. The method includes doping a first portion of the substrate using the patterned photoresist. The method includes removing the patterned photoresist using a gas comprising fluoride, wherein fluoride residue from the gas remains on the top surface of the substrate after removing the patterned photoresist. The method includes treating the substrate with nitrous oxide to remove the fluoride residue.

Abstract: A platform and method for testing antibiotic sensitivity of a polymicrobial infection is provided. The platform includes a body defining a plurality of sets of chambers and a plurality of wells. Each set of chambers has a plurality of chambers adapted for culturing microbes of the polymicrobial infection therein. Each well is associated with a corresponding set of chambers and has an input in fluidic communication with the outlets of the plurality of chambers in the corresponding set of chambers. Selected antibiotic therapies may be received in the wells which fluidically connect the plurality of chambers in a corresponding set of chambers such that microbes cultured in the plurality of chambers in the corresponding set of chambers are in soluble factor contact.

Abstract: According to an aspect, there is provided an electrical socket system comprising: an electrical socket comprising at least one temperature sensor; and a controller configured to monitor a temperature sensed by the temperature sensor, wherein the controller is configured to: determine a temperature gradient of the temperature with respect to time; determine if the temperature gradient exceeds a threshold gradient value; and trigger an alarm event if it is determined that the temperature gradient exceeds the threshold gradient value.

Abstract: According to an aspect, there is provided an electrical socket system comprising: an electrical socket comprising at least one temperature sensor; and a controller configured to monitor a temperature sensed by the temperature sensor, wherein the controller is configured to: determine a temperature gradient of the temperature with respect to time; determine if the temperature gradient exceeds a threshold gradient value; and trigger an alarm event if it is determined that the temperature gradient exceeds the threshold gradient value.

Abstract: A method for forming a semiconductor arrangement is provided. The method includes forming a patterned photoresist over a top surface of a substrate. The method includes doping a first portion of the substrate using the patterned photoresist. The method includes removing the patterned photoresist using a gas comprising fluoride, wherein fluoride residue from the gas remains on the top surface of the substrate after removing the patterned photoresist. The method includes treating the substrate with nitrous oxide to remove the fluoride residue.

Abstract: According to an aspect, there is provided an electrical socket system comprising: an electrical socket comprising at least one temperature sensor; and a controller configured to monitor a temperature sensed by the temperature sensor, wherein the controller is configured to: determine a temperature gradient of the temperature with respect to time; determine if the temperature gradient exceeds a threshold gradient value; and trigger an alarm event if it is determined that the temperature gradient exceeds the threshold gradient value.

Abstract: Embodiments of the disclosure provide systems and methods for measuring performance of a web page and elements of the web page. According to one embodiment, web page performance measurement can comprise initiating measurement of performance of a web page rendered by a client device. The web page can comprise a plurality of elements and the plurality of elements can comprise at least one Web Component element. Performance of the web page can be monitored based on interaction with the client device and one or more performance metrics for each of the elements of the web page receive can be received from the client device. A set of performance metrics for the web page can be maintained. The set of performance metrics can comprise server-side performance metrics based on the monitoring of the performance of the web page and client-side performance metrics received from the client device.

Abstract: An information handling system (IHS) includes a source load switch connected to a power management circuit, and a port for connection of a device. The IHS detects attachment of the device to the port, and determines whether the device is a current sink. When the device is a current sink, the IHS sets the peak processor power level to a reduced level, determines detachment of the device, and in response to determining detachment of the device, restores a maximum peak processor power level. When the device is not a current sink, the HIS starts charging, sets a dynamic peak processor power level to an AC+DC setting, determines detachment of the device, and in response to determining detachment of the device, sets the peak processor power level to a DC-only setting.

Abstract: An information handling system (IHS) includes a source load switch connected to a power management circuit, and a port for connection of a device. The IHS detects attachment of the device to the port, and determines whether the device is a current sink. When the device is a current sink, the IHS sets the peak processor power level to a reduced level, determines detachment of the device, and in response to determining detachment of the device, restores a maximum peak processor power level. When the device is not a current sink, the HIS starts charging, sets a dynamic peak processor power level to an AC+DC setting, determines detachment of the device, and in response to determining detachment of the device, sets the peak processor power level to a DC-only setting.

Abstract: A platform and method for testing antibiotic sensitivity of a polymicrobial infection is provided. The platform includes a body defining a plurality of sets of chambers and a plurality of wells. Each set of chambers has a plurality of chambers adapted for culturing microbes of the polymicrobial infection therein. Each well is associated with a corresponding set of chambers and has an input in fluidic o communication with the outlets of the plurality of chambers in the corresponding set of chambers. Selected antibiotic therapies may be received in the wells which fluidically connect the plurality of chambers in a corresponding set of chambers such that microbes cultured in the plurality of chambers in the corresponding set of chambers are in soluble factor contact.

Abstract: A power supply includes an LLC resonant power converter to provide a first reference signal having a first voltage. The power supply also includes a DC-DC power converter to provide a second reference signal having a second voltage. The DC-DC converter receives power from the first reference signal. The power supply further includes a switch circuit including a first input to receive the first reference signal, a second input to receive the second reference signal, an input to receive a switch control message, and an output coupled to a power rail. The switch circuit is configured to connect the first reference signal and the second reference signal to the power rail based on the switch control message.

Abstract: A power adapter includes a primary side and a secondary side. The primary side rectifies an alternating current voltage. The secondary side is coupled to the primary side, provides a direct current voltage of a specific voltage level to a cable. The second side includes a sensing resistor, and a compensation circuit. The compensation circuit monitors a voltage level across the sensing resistor, and injects a current into the cable based on the voltage level across the sensing resistor.

Abstract: A power supply includes an LLC resonant power converter to provide a first reference signal having a first voltage. The power supply also includes a DC-DC power converter to provide a second reference signal having a second voltage. The DC-DC converter receives power from the first reference signal. The power supply further includes a switch circuit including a first input to receive the first reference signal, a second input to receive the second reference signal, an input to receive a switch control message, and an output coupled to a power rail. The switch circuit is configured to connect the first reference signal and the second reference signal to the power rail based on the switch control message.

Abstract: A power adapter includes a primary side and a secondary side. The primary side rectifies an alternating current voltage. The secondary side is coupled to the primary side, provides a direct current voltage of a specific voltage level to a cable. The second side includes a sensing resistor, and a compensation circuit. The compensation circuit monitors a voltage level across the sensing resistor, and injects a current into the cable based on the voltage level across the sensing resistor.

Abstract: Circuits and methods for improving noise tolerance in memories are disclosed such as those that include biasing a data line above a normal threshold voltage, either by providing a higher data line charge voltage with a voltage source, or by providing a higher data line charge voltage with a current source.

Abstract: A film capacitor comprising (1) of electric conduction electrodes and (2) of semi-crystalline polymeric dielectric film(s), the thickness of which ranges from 1 micron to 80 micron, made by a melt-stretching extrusion process through a die (circular die or flat die) with a drawdown ratio of 30 or higher (the ratio of die gap to the film thickness) at die temperatures higher than the melting point of said semi-crystalline polymer(s). The semi-crystalline polymeric dielectric films made by such melt-stretching extrusion process show a significantly low shrinkage at high temperatures until they are melted. The capacitor comprising such low shrinkage film dielectrics can be used at a much higher temperature than comprising conventional biaxially oriented film dielectrics made of the same plastic materials.