Patents by Inventor Jatinder Dhaliwal

Jatinder Dhaliwal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240020819
    Abstract: Various examples described herein include various mechanisms, techniques, and methods to subtract collected signals caused by a periodic pattern formed on substrates to enable a higher level of defect detection on substrates. Signals detected by various types of metrology and substrate-inspection systems that are caused by periodic patterns on inspected substrates can be reduced or eliminated by, for example, a Fourier analysis of the detected signals. Both gray-scale value thresholds and area thresholds may be applied after the Fourier analysis of the image and are sufficient for defect detection on an image with a substantially-reduced number of false defects or no defects being present in a final image produced after processing. Other techniques and methods are also disclosed.
    Type: Application
    Filed: July 11, 2023
    Publication date: January 18, 2024
    Inventors: Roman S. Basistyy, Jin Ju, Jian Ding, Jatinder Dhaliwal
  • Publication number: 20230012917
    Abstract: Disclosed herein are examples of defect detection techniques for inspecting semiconductor devices, such as CMOS image sensors, during the manufacturing process. The defects can include common defects, such as scratches, dirt, etc., as well as low-contrast defects, such as watermarks. The detection technique may use a supervised machine learning network.
    Type: Application
    Filed: July 18, 2022
    Publication date: January 19, 2023
    Inventors: Roman S. Basistyy, Jatinder Dhaliwal, Jian Ding
  • Patent number: 11286317
    Abstract: The present invention provides a morphology modified heterophase polymer having No-Break impact strength in the range of 500 J/m-700 J/m as per ASTM standard D256, a high melt flow index in the range of 100 g/10 min as per ASTM D1238, and a balanced flexural modulus as per ASTM standard D790. More particularly, the present invention relates to a process for the modification of morphology of heterophase propylene polymer in the presence of an initiator in the form of organic peroxide and a multifunctional unsaturated organic vinyl compound on the ex-reactor Heterophase Propylene Copolymer powder and/or pellet using special extrusion device.
    Type: Grant
    Filed: February 26, 2020
    Date of Patent: March 29, 2022
    Assignee: Indian Oil Corporation Limited
    Inventors: Vimal Kakkarakkal Kottiyath, Saranya Sethuramalingam, Naresh Shiva, Jatinder Dhaliwal Singh, Vishal Goel, Ptabhu Narain Chakrawal, Abhilasha Mishra, Shashikant, Gurpreet Singh Kapur, Sankara Sri Venkata Ramakumar
  • Publication number: 20200325256
    Abstract: The present invention provides a morphology modified heterophase polymer having No-Break impact strength in the range of 500 J/m-700 J/m as per ASTM standard D256, a high melt flow index in the range of 100 g/10 min as per ASTM D1238, and a balanced flexural modulus as per ASTM standard D790. More particularly, the present invention relates to a process for the modification of morphology of heterophase propylene polymer in the presence of an initiator in the form of organic peroxide and a multifunctional unsaturated organic vinyl compound on the ex-reactor Heterophase Propylene Copolymer powder and/or pellet using special extrusion device.
    Type: Application
    Filed: February 26, 2020
    Publication date: October 15, 2020
    Inventors: Vimal Kakkarakkal KOTTIYATH, Saranya SETHURAMALINGAM, Naresh SHIVA, Jatinder Dhaliwal SINGH, Vishal GOEL, Ptabhu Narain CHAKRAWAL, Abhilasha MISHRA, Shashikant, Gurpreet Singh KAPUR, Sankara Sri Venkata RAMAKUMAR
  • Patent number: 10024804
    Abstract: A system for assessing a structure and the tools and processes used to form the structure is described. 2D images of the structure are captured and processed to obtain 3D information concerning the structure. Both 2D and 3D information is then used to identify and analyze selected characteristics of the structure. This analysis allows for a quality assessment of the structure. The selected characteristics are correlated with information relating to the operation of the tool that carried out the process that at least in part created the structure. The correlation of tool/process information to structure characteristics allows for the generation of feedback that may be used to modify the tool or processed used to form the structure.
    Type: Grant
    Filed: May 22, 2017
    Date of Patent: July 17, 2018
    Assignee: Rudolph Technologies, Inc.
    Inventors: John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael Grant, Kenneth Durden
  • Publication number: 20170254757
    Abstract: A system for assessing a structure and the tools and processes used to form the structure is described. 2D images of the structure are captured and processed to obtain 3D information concerning the structure. Both 2D and 3D information is then used to identify and analyze selected characteristics of the structure. This analysis allows for a quality assessment of the structure. The selected characteristics are correlated with information relating to the operation of the tool that carried out the process that at least in part created the structure. The correlation of tool/process information to structure characteristics allows for the generation of feedback that may be used to modify the tool or processed used to form the structure.
    Type: Application
    Filed: May 22, 2017
    Publication date: September 7, 2017
    Applicant: Rudolph Technologies, Inc.
    Inventors: John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael Grant, Kenneth Durden
  • Patent number: 9658169
    Abstract: A system for assessing a structure and the tools and processes used to form the structure is described. 2D images of the structure are captured and processed to obtain 3D information concerning the structure. Both 2D and 3D information is then used to identify and analyze selected characteristics of the structure. This analysis allows for a quality assessment of the structure. The selected characteristics are correlated with information relating to the operation of the tool that carried out the process that at least in part created the structure. The correlation of tool/process information to structure characteristics allows for the generation of feedback that may be used to modify the tool or processed used to form the structure.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: May 23, 2017
    Assignee: Rudolph Technologies, Inc.
    Inventors: John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael Grant, Kenneth Durden
  • Publication number: 20150316487
    Abstract: A system for assessing a structure and the tools and processes used to form the structure is described. 2D images of the structure are captured and processed to obtain 3D information concerning the structure. Both 2D and 3D information is then used to identify and analyze selected characteristics of the structure. This analysis allows for a quality assessment of the structure. The selected characteristics are correlated with information relating to the operation of the tool that carried out the process that at least in part created the structure. The correlation of tool/process information to structure characteristics allows for the generation of feedback that may be used to modify the tool or processed used to form the structure.
    Type: Application
    Filed: March 14, 2014
    Publication date: November 5, 2015
    Applicant: Rudolph Technologies, Inc.
    Inventors: John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael Grant, Kenneth Durden
  • Publication number: 20140320635
    Abstract: A system for assessing a structure and the tools and processes used to form the structure is described. 2D images of the structure are captured and processed to obtain 3D information concerning the structure. Both 2D and 3D information is then used to identify and analyze selected characteristics of the structure. This analysis allows for a quality assessment of the structure. The selected characteristics are correlated with information relating to the operation of the tool that carried out the process that at least in part created the structure. The correlation of tool/process information to structure characteristics allows for the generation of feedback that may be used to modify the tool or processed used to form the structure.
    Type: Application
    Filed: March 14, 2014
    Publication date: October 30, 2014
    Applicant: Rudolph Technologies, Inc.
    Inventors: John Thornell, Steven Knauber, Jatinder Dhaliwal, Justin Miller, Michael Grant, Kenneth Durden