Patents by Inventor Javier Ignacio Etcheverry

Javier Ignacio Etcheverry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240003848
    Abstract: A method of testing of a component of a system that includes a pipe of a first length is provided. The method includes the steps of: providing a second length of stock pipe, the second length being greater than the first length; cutting the stock pipe to the first length to produce a cut pipe; inspecting the cut pipe using a non-destructive inspection technique. The non-destructive inspection technique includes the steps of: performing a first non-destructive test on an inner surface of the cut pipe; performing a second non-destructive test on an outer surface of the cut pipe. The method further includes the step of rejecting the cut pipe if the step of inspecting the pipe identifies a flaw.
    Type: Application
    Filed: September 15, 2023
    Publication date: January 4, 2024
    Applicant: Tenaris Connections B.V.
    Inventors: Alberto Nicolini, Nicolas Hernan Bonadeo, Benito Perez Solorzano, Javier Ignacio Etcheverry
  • Patent number: 10197387
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Grant
    Filed: October 3, 2014
    Date of Patent: February 5, 2019
    Assignee: TENARIS CONNECTIONS B.V.
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Publication number: 20150022823
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Application
    Filed: October 3, 2014
    Publication date: January 22, 2015
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Patent number: 8855965
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Grant
    Filed: June 1, 2011
    Date of Patent: October 7, 2014
    Assignee: Tenaris Connections Limited
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Patent number: 8744160
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Grant
    Filed: June 1, 2011
    Date of Patent: June 3, 2014
    Assignee: Tenaris Connections Limited
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Patent number: 8682465
    Abstract: A measurement method for thread parameters for a threaded object (3), by means of a measurement device (1) defining a spatial reference system (X, Y, Z) incorporating an optical sensor (5) to retrieve the shape of the threaded object, and defining a spatial reference system (X?, Y?, Z?), the measurement device (1) having a computer to assemble a first matrix that describes the quadratic form representing the threaded object in the spatial reference system (X, Y, Z), thus providing the relationship between the two spatial reference systems.
    Type: Grant
    Filed: December 3, 2009
    Date of Patent: March 25, 2014
    Assignee: Tenaris Connections Limited
    Inventors: Nicolás Hernán Bonadeo, Sebastián Berra, Javier Ignacio Etcheverry
  • Publication number: 20110293169
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Application
    Filed: June 1, 2011
    Publication date: December 1, 2011
    Applicant: Tenaris Connections Limited
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Publication number: 20110295550
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Application
    Filed: June 1, 2011
    Publication date: December 1, 2011
    Applicant: Tenaris Connections Limited
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Publication number: 20110238199
    Abstract: A measurement method for thread parameters for a threaded object (3), by means of a measurement device (1) defining a spatial reference system (X, Y, Z) incorporating an optical sensor (5) to retrieve the shape of the threaded object, and defining a spatial reference system (X?, Y?, Z?), the measurement device (1) having a computer to assemble a first matrix that describes the quadratic form representing the threaded object in the spatial reference system (X, Y, Z), thus providing the relationship between the two spatial reference systems.
    Type: Application
    Filed: December 3, 2009
    Publication date: September 29, 2011
    Applicant: TENARIS CONNECTIONS LIMITED
    Inventors: Nicolás Hernán Bonadeo, Sebastián Berra, Javier Ignacio Etcheverry