Abstract: An optoelectronic module comprising: a radiation-emitting device; a housing comprising a wall or walls laterally surrounding the radiation-emitting device; two or more terminals disposed on a surface of the wall or walls; a transparent substrate abutting the housing, the transparent substrate comprising an interlock feature; a control unit coupled to the two or more terminals, wherein the control unit is configured to: supply an electrical current though the interlock feature; monitor an electrical parameter associated with the interlock feature; wherein the terminals are arranged such that: when the transparent substrate is in a first orientation about an optical axis of the radiation-emitting device, the interlock feature is coupled to at least two of the two or more terminals and the optoelectronic module is operable to provide a field of illumination in a first illumination orientation; and when the transparent substrate is in a second orientation about the optical axis of the radiation-emitting device, t

Abstract: An example system includes a first light source, a second light source, a photodetector, and an electronic control device. The electronic control device is operable to cause the first light source to emit first light within a range of wavelengths towards a subject, and measure, using the photodetector, the first light reflected from the subject. The electronic control device is also operable to cause the second light source to emit second light including a plurality of emission peaks within the range of wavelengths, and measure, using the photodetector, the second light. The electronic control device is also operable to determine spectral information regarding the subject based on the measured first light and the measured second light.

Abstract: An optical sensor. The optical sensor comprises a substrate, a Fabry-Perot interferometer, and first and second photodetectors. The Fabry-Perot interferometer comprises a first mirror and a second mirror, and is mounted on the substrate such that light is transmitted through the interferometer to the substrate. The first and second photodetectors are configured to detect light transmitted through the etalon and the substrate. The first photodetector is sensitive to a first wavelength range, and the second photodetector is sensitive to a second wavelength range, and wherein the first and second wavelength ranges each correspond to a different mode of the interferometer.

Abstract: An example system includes a first spectrometer, a second spectrometer, and an electronic control device communicatively coupled to the first spectrometer and the second spectrometer. The first spectrometer is operable to emit first light using a first light source towards a sample region between the first spectrometer and the second spectrometer. The first spectrometer is also operable to measure first reflected light reflected using a first photodetector from an object in the sample region. The second spectrometer is operable to measure first transmitted light transmitted through the object using a second photodetector. The electronic control device is operable to determine, based on at least one of the measured first reflected light or the measured first transmitted light, a spectral distribution of light corresponding to the object.

Abstract: A sensing system is disclosed for performing distance measurements. The sensing system may include an emitter configured to emit electromagnetic radiation modulated at a known frequency. The sensing system may further include a detector configured to sample incident electromagnetic radiation at the known frequency, convert the sampled electromagnetic radiation into charge carriers, and collect the charge carriers in a storage component to produce an electronic signal. The sensing system may include a processor configured to determine a correction by applying a non-linear polynomial function to the electronic signal.

Abstract: An optical sensor. The optical sensor comprises a substrate and a Fabry-Perot interferometer. The substrate is formed from a semiconductor. The Fabry-Perot interferometer comprises a first mirror and a second mirror, and is mounted on the substrate such that light is transmitted through the interferometer to the substrate. The substrate is doped such that a region of the substrate to which light is transmitted by the interferometer forms a photodiode.

Abstract: An apparatus for monitoring mechanical integrity of an eye-safety component of an illuminator is disclosed. The apparatus comprises a transducer operable to create a vibration in the eye-safety component, a sensor operable to sense the vibration in the eye safety component and to output a signal representative of the sensed vibration, and a processor. The processor is operable to: monitor the signal from the sensor; determine if the signal comprises at least one parameter that falls outside of a pre-determined acceptable range, the pre-determined acceptable range being indicative of mechanical integrity of the eye-safety component; and initiate a safety action in response to a determination that the at least one parameter falls outside of the pre-determined acceptable range thereby indicating a loss of mechanical integrity.

Abstract: An illumination system (200) includes an illumination device (202); an optical element (206) positioned to receive light (208) from the illumination device (202); a layer (210) of a transparent material disposed on the optical element (206) and positioned to receive light (208) from the illumination device (202); and an interlock circuit (220) configured to measure a resistivity of the layer (210) of transparent material and to control operation of the illumination device (202) based on the measured resistivity.

Abstract: A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said range and operating said component to vary said driving parameter whilst detecting light transmitted through said layer of material to obtain driving parameter versus light intensity data. The obtained data is then compared with characterizing data previously derived for said layer of material in order to calibrate said driving parameter.

Abstract: An apparatus for monitoring mechanical integrity of an eye-safety component of an illuminator is disclosed. The apparatus comprises a sensor, operable to sense a photoacoustic effect in the eye-safety component during operation of the illuminator and to output a signal representative of the sensed photoacoustic effect, and a processor. The processor is operable to: monitor the signal from the sensor; determine if the signal comprises at least one parameter that falls outside of a pre-determined acceptable range, the pre-determined acceptable range being indicative of mechanical integrity of the eye-safety component; and initiate a safety action in response to a determination that the at least one parameter falls outside of the pre-determined acceptable range thereby indicating a loss of mechanical integrity.

Abstract: According to a first aspect of the present invention there is provided a method of measuring the optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another. The method comprises illuminating the target with the light emitter, detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal SS indicative of the intensity of the detected light, and determining the optical reflectance R of the target according to (Formula 1), where RR is the spectral reflectance of a reference standard, SR is the detector electrical output signal with the reference standard in place, SH is the detector electrical output signal with no target in front of the light emitter and light detector, and M is a calibration factor.

Abstract: A spectral sensor comprising a Fabry-Perot interferometer having a pair of reflectors, a photodetector located beneath the Fabry-Perot interferometer, a capacitance measurement circuit configured to measure a capacitance of the Fabry-Perot interferometer, and a controller configured to control a voltage applied across the reflectors of the Fabry-Perot interferometer.

Abstract: An example system includes a light source, a first spectrometer, a second spectrometer, and an electronic control module. The light source is operable to emit light within a first range of wavelengths in a field of illumination. The first spectrometer is operable to measure first sample light reflected from an object within a second range of wavelengths and in a first field of detection. The second spectrometer is operable to measure second sample light reflected from the object within a third range of wavelengths and in a second field of detection. The electronic control module operable to determine, based on the measured first sample light and the measured second sample light, a distance between the system and the object, and determine, based on the measured first sample light and the measured second sample light, a spectral distribution of light corresponding to the object.

Abstract: An illumination system (200) includes an illumination device (202); an optical element (206) positioned to receive light (208) from the illumination device (202); a layer (210) of a transparent material disposed on the optical element (206) and positioned to receive light (208) from the illumination device (202); and an interlock circuit (220) configured to measure a resistivity of the layer (210) of transparent material and to control operation of the illumination device (202) based on the measured resistivity

Abstract: An example system includes a first light source, a second light source, a photodetector, and an electronic control device. The electronic control device is operable to cause the first light source to emit first light within a range of wavelengths towards a subject, and measure, using the photodetector, the first light reflected from the subject. The electronic control device is also operable to cause the second light source to emit second light including a plurality of emission peaks within the range of wavelengths, and measure, using the photodetector, the second light. The electronic control device is also operable to determine spectral information regarding the subject based on the measured first light and the measured second light.

Abstract: An example system includes a housing defining a cavity and an aperture, a photodetector disposed within the cavity, a voltage-tunable interferometer disposed within the cavity between the aperture and the photodetector, a first light source disposed within the cavity, and an electronic control device. The electronic control device is operable to vary an input voltage applied to the interferometer, and concurrently, cause the first light source to emit light towards the interferometer and measure light reflected from the interferometer using the photodetector. The electronic control device is also operable to determine a calibrated input voltage based on light reflected from the interferometer and measured by the photodetector. The electronic control device is also operable to apply the calibrated input voltage to the interferometer, and concurrently, obtain one or more spectral measurements using the photodetector.

Abstract: In an example method, light is emitted towards a sample region, and sample light is received at an interferometer. A subset of the sample light is transmitted from the interferometer to a detector. Transmitting the subset of the sample light includes determining a reference voltage corresponding to the range of wavelengths of the subset of sample light, and a reference temperature. Transmitting the subset of sample light also includes determining a temperature of an environment, determining a bias voltage corresponding to a difference between the reference temperature and the temperature of the environment, and applying, to the interferometer, an input voltage corresponding to the sum of the reference voltage and the bias voltage. The subset of the sample light is measured by the detector, and a spectral distribution of light is determined based on the measurements.

Abstract: An example system includes a light source, a first spectrometer, a second spectrometer, and an electronic control module. The light source is operable to emit light within a first range of wavelengths in a field of illumination. The first spectrometer is operable to measure first sample light reflected from an object within a second range of wavelengths and in a first field of detection. The second spectrometer is operable to measure second sample light reflected from the object within a third range of wavelengths and in a second field of detection. The electronic control module operable to determine, based on the measured first sample light and the measured second sample light, a distance between the system and the object, and determine, based on the measured first sample light and the measured second sample light, a spectral distribution of light corresponding to the object.

Abstract: An example system includes a first spectrometer, a second spectrometer, and an electronic control device communicatively coupled to the first spectrometer and the second spectrometer. The first spectrometer is operable to emit first light using a first light source towards a sample region between the first spectrometer and the second spectrometer. The first spectrometer is also operable to measure first reflected light reflected using a first photodetector from an object in the sample region. The second spectrometer is operable to measure first transmitted light transmitted through the object using a second photodetector. The electronic control device is operable to determine, based on at least one of the measured first reflected light or the measured first transmitted light, a spectral distribution of light corresponding to the object.

Abstract: The present disclosure describes calibration methods for optoelectronic modules with active illumination, such as 3D ranging systems. Calibration methods include determining cross-talk calibration parameters for an optoelectronic module having an emitting channel and a receiving channel where the optoelectronic module is operable to demodulate modulated light incident on the receiving channel. Cross-talk calibration parameters are saved to a readable storage medium and recalled during distance measurements to an object or objects in a scene.