Abstract: A microscope includes a light source positioned at a light source plane of the microscope, a pattern projection component positioned at a light stop plane of the microscope, and an optical sensor positioned at an image plane of the microscope. The light source is configured to transmit light to an object plane of the microscope via the pattern projection component. The pattern projection component is configured to, when the light interacts with the pattern projection component, cause the light to carry a pattern. The pattern, when the light transmits from the pattern projection component to an object positioned at the object plane, is projected on a region of the object.

Abstract: Some implementations include an opto-mechanical assembly of a microscope system for testing an end face of an optical fiber. The opto-mechanical assembly may include an imaging device configured to capture an image of an end face of an optical fiber and a focus assembly comprising a system of lenses configured to focus the image of the end face of the optical fiber for capture by the imaging device; and at least one focus position encoder associated with the focus assembly and configured to determine at least one focus position measurement associated with a position of at least one lens of the system of lenses. The device may use the at least one focus position measurement to determine a magnification associated with the focus assembly.

Abstract: In some implementations, a device may receive, from one or more programmable components disposed in a changeable tip of an imaging device, a signal indicating tip configuration information associated with the removable tip. The device may activate software that causes one or more processors to configure, based on the tip configuration information, at least one testing parameter associated with a test to inspect an image of an end face of an optical fiber for compliance with a set of criteria related to a condition of the end face of the optical fiber. The device may output a result of the test that indicates a compliance status associated with the set of criteria.

Abstract: Some implementations include an opto-mechanical assembly of a microscope system for testing an end face of an optical fiber. The opto-mechanical assembly may include an imaging device configured to capture an image of an end face of an optical fiber and a focus assembly comprising a system of lenses configured to focus the image of the end face of the optical fiber for capture by the imaging device; and at least one focus position encoder associated with the focus assembly and configured to determine at least one focus position measurement associated with a position of at least one lens of the system of lenses. The device may use the at least one focus position measurement to determine a magnification associated with the focus assembly.

Abstract: In some implementations, a device may receive, from one or more programmable components disposed in a changeable tip of an imaging device, a signal indicating tip configuration information associated with the removable tip. The device may activate software that causes one or more processors to configure, based on the tip configuration information, at least one testing parameter associated with a test to inspect an image of an end face of an optical fiber for compliance with a set of criteria related to a condition of the end face of the optical fiber. The device may output a result of the test that indicates a compliance status associated with the set of criteria.

Abstract: A device for inspecting a set of one or more optical fibers included in an optical cable includes a microscope; one or more adjustment components; and one or more processors. The one or more processors determine that an optical connector is connected to the optical cable and identify a structural feature of the optical connector. The one or more processors cause the one or more adjustment components to adjust the microscope to a particular position such that the structural feature of the optical connector is within an on-axis region of a field of view of a lens of the microscope, and thereby cause a camera of the microscope to obtain one or more images associated with the structural feature of the optical connector. The one or more processors analyze the one or more images to generate assessment information associated with the structural feature and then provide the assessment information.

Abstract: An optical tip includes an optical system that includes a set of optical components. The optical tip is configured to interface with a device that includes a microscope that is configured to inspect an optical connector attached to an optical cable. The set of optical components are configured to reorient a first major dimension of a field of view of the microscope of the device to not align with a second major dimension of a sensor of the device.

Abstract: Some implementations include a changeable tip of a microscope system for testing an end face of an optical fiber. The changeable tip may include a tip housing having an optical fiber interface at a first end of the housing and configured to be coupled with the end face of the optical fiber and a device interface configured to be coupled with a tip connection interface of an opto-mechanical assembly of the microscope system. The changeable tip also may include at least one tip orientation indicator associated with the tip housing and configured to interact with a tip connection interface of the opto-mechanical assembly to cause a signal indicating tip orientation information associated with the changeable tip to be provided to the imaging device.

Abstract: Some implementations include a changeable tip of a microscope system for testing an end face of an optical fiber. The changeable tip may include a tip housing having an optical fiber interface at a first end of the housing and configured to be coupled with the end face of the optical fiber and a device interface configured to be coupled with a tip connection interface of an opto-mechanical assembly of the microscope system. The changeable tip also may include at least one tip orientation indicator associated with the tip housing and configured to interact with a tip connection interface of the opto-mechanical assembly to cause a signal indicating tip orientation information associated with the changeable tip to be provided to the imaging device.

Abstract: A microscope may receive a fiber optic connector via a connector adapter that includes an opening and may align a ferrule of the fiber optic connector with the opening of the connector adapter, where the ferrule includes a ferrule endface. The microscope may transmit light onto the ferrule endface and may receive reflected light, as an image of the ferrule endface, with a camera of the microscope. The microscope may determine intensities of brightness of the image and may create a topographical map of the intensities of the brightness of the image. The microscope may determine a radius and an apex of the ferrule endface based on the topographical map and may calculate an apex offset of the ferrule endface based on the radius and the apex of the ferrule endface. The microscope may perform one or more actions based on the apex offset of the ferrule endface.

Abstract: In some implementations, a device may receive, from one or more programmable components disposed in a changeable tip of an imaging device, a signal indicating tip configuration information associated with the removable tip. The device may activate software that causes one or more processors to configure, based on the tip configuration information, at least one testing parameter associated with a test to inspect an image of an end face of an optical fiber for compliance with a set of criteria related to a condition of the end face of the optical fiber. The device may output a result of the test that indicates a compliance status associated with the set of criteria.

Abstract: Some implementations include a changeable tip of a microscope system for testing an end face of an optical fiber. The changeable tip may include a tip housing having an optical fiber interface at a first end of the housing and configured to be coupled with the end face of the optical fiber and a device interface configured to be coupled with a tip connection interface of an opto-mechanical assembly of the microscope system. The changeable tip also may include at least one tip orientation indicator associated with the tip housing and configured to interact with a tip connection interface of the opto-mechanical assembly to cause a signal indicating tip orientation information associated with the changeable tip to be provided to the imaging device.

Abstract: Some implementations include an opto-mechanical assembly of a microscope system for testing an end face of an optical fiber. The opto-mechanical assembly may include an imaging device configured to capture an image of an end face of an optical fiber and a focus assembly comprising a system of lenses configured to focus the image of the end face of the optical fiber for capture by the imaging device; and at least one focus position encoder associated with the focus assembly and configured to determine at least one focus position measurement associated with a position of at least one lens of the system of lenses. The device may use the at least one focus position measurement to determine a magnification associated with the focus assembly.

Abstract: In some implementations, a device may selectively illuminate, via a lighting module of the device, one or more fibers in a fiber optic cable using an illumination pattern. The device may detect, via a detection module of the device, illuminated fibers associated with the fiber optic cable based on the illumination pattern. The device may output, via the detection module of the device, information regarding the illuminated fibers. The device may generate, via one or more processors of the device, a report, based on the information, indicating a fiber mapping between the one or more fibers that were selectively illuminated via the lighting module and the illuminated fibers detected via the detection module.

Abstract: A microscope may receive a fiber optic connector via a connector adapter of the microscope, wherein the connector adapter includes an opening and a shaped reflective surface surrounding the opening. The microscope may align a ferrule of the fiber optic connector with the opening of the connector adapter of the microscope, wherein the ferrule includes a ferrule endface. The microscope may transmit light onto the shaped reflective surface and may receive reflected light from the ferrule endface and with a camera of the microscope.

Abstract: A microscope may receive a fiber optic connector via a connector adapter of the microscope, wherein the connector adapter includes an opening and a shaped reflective surface surrounding the opening. The microscope may align a ferrule of the fiber optic connector with the opening of the connector adapter of the microscope, wherein the ferrule includes a ferrule endface. The microscope may transmit light onto the shaped reflective surface and may receive reflected light from the ferrule endface and with a camera of the microscope.

Abstract: A microscope may receive a fiber optic connector via a connector adapter that includes an opening and may align a ferrule of the fiber optic connector with the opening of the connector adapter, where the ferrule includes a ferrule endface. The microscope may transmit light onto the ferrule endface and may receive reflected light, as an image of the ferrule endface, with a camera of the microscope. The microscope may determine intensities of brightness of the image and may create a topographical map of the intensities of the brightness of the image. The microscope may determine a radius and an apex of the ferrule endface based on the topographical map and may calculate an apex offset of the ferrule endface based on the radius and the apex of the ferrule endface. The microscope may perform one or more actions based on the apex offset of the ferrule endface.