Patents by Inventor Jay J. Chen

Jay J. Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030184750
    Abstract: An ellipsometer or reflectometer includes a light source creating a mono or polychromatic probe beam. The probe beam is focused by one or more lenses to create an illumination spot on the surface of the subject under test. A second lens (or lenses) images the illumination spot (or a portion of the illumination spot) to a detector. The detector captures (or otherwise processes) the received image. A processor analyzes the data collected by the detector. An aperture is positioned along the beam bath between the light source and the detector. The aperture has an elliptical shape to give the image received by the detector a circular shape. The circular shape maximizes the amount of energy that may be received using a square test area.
    Type: Application
    Filed: September 24, 2002
    Publication date: October 2, 2003
    Inventors: David M. Aikens, Jay J. Chen, Lanhua Wei