Patents by Inventor Jay J. Nejedio

Jay J. Nejedio has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for interconnect built-in self test based system management performance tuning
    Patent number: 6907377
    Abstract: A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Performance Tuning provides for measuring operating conditions of an interconnect, which is between a first device and a second device in a post-production system, at operating speed with a set of one or more test data and a first set of one or more operating parameters. Results of the measuring are stored and operating conditions of the interconnect with the set of test data and a second set of operating parameters are measured. The method and apparatus further provides for selecting either the first or second set of operating parameters based on the measuring of operating conditions to optimize operation of the post-production system.
    Type: Grant
    Filed: March 31, 2003
    Date of Patent: June 14, 2005
    Assignee: Intel Corporation
    Inventors: Thomas M. Slaight, Jay J. Nejedio, Russell L. Carr
  • Method and apparatus for interconnect built-in self test based system management performance tuning
    Publication number: 20040204879
    Abstract: A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Performance Tuning provides for measuring operating conditions of an interconnect, which is between a first device and a second device in a post-production system, at operating speed with a set of one or more test data and a first set of one or more operating parameters. Results of the measuring are stored and operating conditions of the interconnect with the set of test data and a second set of operating parameters are measured. The method and apparatus further provides for selecting either the first or second set of operating parameters based on the measuring of operating conditions to optimize operation of the post-production system.
    Type: Application
    Filed: March 31, 2003
    Publication date: October 14, 2004
    Inventors: Thomas M. Slaight, Jay J. Nejedio, Russell L. Carr