Patents by Inventor Jay M. Amos

Jay M. Amos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11221312
    Abstract: An adhesive bond test resonance array provides inspection of adhesively bonded composite laminate structures with improved productivity and higher reliability. A holder has multiple slots arranged in a two-dimensional array for holding transducers in respective slots. The holder is adapted to position a probe end of each of the transducers adjacent a component for scanning and has a material hardness adapted for enabling flexing while scanning curved composite parts. A fluid channel is adapted for delivering a couplant to the probe end of the transducers such that the couplant is automatically delivered during scanning of the component to inspect bond integrity.
    Type: Grant
    Filed: July 11, 2019
    Date of Patent: January 11, 2022
    Assignee: Textron Innovations, Inc.
    Inventors: Jay M. Amos, Bharath Kumar Kodumuru
  • Publication number: 20200018728
    Abstract: An adhesive bond test resonance array provides inspection of adhesively bonded composite laminate structures with improved productivity and higher reliability. A holder has multiple slots arranged in a two-dimensional array for holding transducers in respective slots. The holder is adapted to position a probe end of each of the transducers adjacent a component for scanning and has a material hardness adapted for enabling flexing while scanning curved composite parts. A fluid channel is adapted for delivering a couplant to the probe end of the transducers such that the couplant is automatically delivered during scanning of the component to inspect bond integrity.
    Type: Application
    Filed: July 11, 2019
    Publication date: January 16, 2020
    Inventors: Jay M. Amos, Bharath Kumar Kodumuru
  • Patent number: 9194687
    Abstract: A nondestructive system and method for measuring non-conductive coating thickness is disclosed. The method includes providing a composite substrate, placing a conductive layer over a surface of the composite substrate, and depositing a plurality of non-conductive coating layers over the conductive layer. An eddy-current measuring coil formed on a printed circuit board is provided atop the coating layers. The coil has a driving trace with first and second driving electrodes, and a receiving trace having first and second receiving electrodes. The receiving and driving traces can be either coaxial or interwoven, are spaced apart, and share a common center. A load administered to the first and second driving electrodes using an eddyscope is measured across the first and second receiving electrodes to determine impedance; the measured impedance is used to determine a total thickness of the plurality of coating layers and whether an overall coating thickness is uniform.
    Type: Grant
    Filed: February 1, 2011
    Date of Patent: November 24, 2015
    Assignee: Textron Innovations Inc.
    Inventors: Feng Yu, Jay M. Amos
  • Patent number: 7126123
    Abstract: A method and an apparatus for inspecting parts for surface contamination including the steps of covering the part with a film of water, and then scanning the wetted part with a infrared camera to preserve the reflected image of the reflected infrared light thereby defining a water break area of contamination.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: October 24, 2006
    Assignee: Cessna Aircraft Company
    Inventors: Jay M. Amos, Alan R. Gilbert
  • Patent number: 6229872
    Abstract: A method and an apparatus generate a plurality of inspection signals each indicative of an internal physical characteristic of a portion of an object. Each of the inspection signals is generated with a different orientation relative to the portion of the object. A signal is generated indicative of a measure of correlation between the inspection signals. The method and the apparatus can be used to reduce the effect of noise and/or distortion in regard to inspection of objects. In one detailed embodiment, the inspection signals are x-ray images indicative of a density of an object. The x-ray images are processed to identify indications in the x-ray images that indicate a density associated with a defect. The indications in the images are then compared to each other to determine whether there is a correlation between the indications. Low correlation between the indications tends to indicate the presence of distortion in the inspection signals.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: May 8, 2001
    Assignee: United Technologies Corporation
    Inventor: Jay M. Amos
  • Patent number: 5207005
    Abstract: A probe for inspecting contoured surfaces by transmitting and receiving eddy currents includes a shaft disposed in spatial relationship with the contoured surface and a pivotal probe manipulator rotatably mounted on the end of the shaft and having a critical dimension including the location of the pivot point and the width of the probe manipulator and spring means urging the probe manipulator against the contoured surface so that the probe travels along the surface and rotates substantially .+-.90 degrees relative to the shaft.
    Type: Grant
    Filed: July 20, 1992
    Date of Patent: May 4, 1993
    Assignee: United Technologies Corporation
    Inventors: Jay M. Amos, David A. Raulerson