Patents by Inventor Jay M. Wardle

Jay M. Wardle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9844079
    Abstract: A signal analyzer comprises: a first tuner configured to tune to a first frequency band and to output first tuner data; a memory device configured to store the first tuner data; a spectrum calculator configured to calculate a series of spectra for the first tuner data; a processor configured to determine a presence of a transmission of interest within the first tuner data based on the series of spectra; a second tuner configured to receive the first tuner data stored in the memory device and to tune to a second frequency band including the transmission of interest. The second tuner outputs second tuner data in response to the stored first tuner data. The signal analyzer also comprises a transmission start time detector configured to receive the second tuner data and to determine a start time for the transmission of interest from the second tuner data.
    Type: Grant
    Filed: October 27, 2010
    Date of Patent: December 12, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: John H. Guilford, Jay M. Wardle
  • Patent number: 6167457
    Abstract: A method for establishing bindings in distributed systems is based on a relational characterization interface (RCI) that includes the following fields: ensemble, message type, and variable name. Optional fields may be specified such as time stamp, units, location, and value. The RCI uses explicit representation and standard representations for data and other communication entities to minimize the difficulty in establishing the necessary communication between parts of these systems while maximizing the interoperability properties of the components of these systems. In addition, the interface allows for the use of distributed or collective entities. A variety of services and other supporting methods are enabled by the RCI.
    Type: Grant
    Filed: December 11, 1996
    Date of Patent: December 26, 2000
    Assignee: Agilent Technologies
    Inventors: John C Eidson, Clark Nicholson, Gerald Weibel, Dennis O'Brien, Jay M Wardle, Glenn R. Engel, Ronald van der Meulen
  • Patent number: 6046595
    Abstract: The phase response of a network is measured at uniform frequency intervals. A linear regression analysis is performed on samples of the phase response measured at frequencies within an aperture centered on a group delay frequency to obtain an estimate of the group delay of the network at that frequency. The process is repeated for a sequence of group delay frequencies to determine a trace of the group delay of the network across a range of frequencies.
    Type: Grant
    Filed: December 2, 1994
    Date of Patent: April 4, 2000
    Assignee: Hewlett-Packard Company
    Inventor: Jay M. Wardle
  • Patent number: 5420514
    Abstract: The sweep rate limitations that heretofore have constrained the maximum sweep rates of swept analysis instruments are obviated by optimizing filter circuitry and post-processing the IF signal using various techniques to compensate for errors caused by fast sweeping. Some selective windowing is also used to compensate for distortions due to fast sweep rates.
    Type: Grant
    Filed: February 7, 1994
    Date of Patent: May 30, 1995
    Assignee: Hewlett-Packard Company
    Inventors: Jay M. Wardle, Ronald W. Potter, John A. Gibbs
  • Patent number: 5399976
    Abstract: The phase response of a network is measured at uniform frequency intervals. A linear regression analysis is performed on samples of the phase response measured at frequencies within an aperture centered on a group delay frequency to obtain an estimate of the group delay of the network at that frequency. The process is repeated for a sequence of group delay frequencies to determine a trace of the group delay of the network across a range of frequencies.
    Type: Grant
    Filed: February 5, 1993
    Date of Patent: March 21, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Jay M. Wardle
  • Patent number: 5300878
    Abstract: The sweep rate limitations that heretofore have constrained the maximum sweep rates of swept analysis instruments are obviated by optimizing filter circuitry and post-processing the IF signal using various techniques to compensate for errors caused by fast sweeping.
    Type: Grant
    Filed: November 19, 1992
    Date of Patent: April 5, 1994
    Assignee: Hewlett-Packard Company
    Inventors: Jay M. Wardle, Ronald W. Potter, John A. Gibbs
  • Patent number: 5168213
    Abstract: The sweep rate limitations that heretofore have constrained the maximum sweep rates of swept analysis instruments (10,38) are obviated by optimizing filter circuitry (24,32,34,46) and post-processing the IF signal using various techniques to compensate for errors caused by fast sweeping.
    Type: Grant
    Filed: January 9, 1992
    Date of Patent: December 1, 1992
    Assignee: Hewlett-Packard Company
    Inventors: Jay M. Wardle, Ronald W. Potter, John A. Gibbs
  • Patent number: 5117179
    Abstract: The sweep rate limitations that heretofore have constrained the maximum sweep rates of swept analysis instruments are obviated by optimizing filter circuitry and post-processing the IF signal using various techniques to compensate for errors caused by fast sweeping.
    Type: Grant
    Filed: March 13, 1990
    Date of Patent: May 26, 1992
    Assignee: Hewlett-Packard Company
    Inventors: Jay M. Wardle, Ronald W. Potter, John A. Gibbs