Abstract: Thermal conditions can be simulated for an electronic device. Application developers may want to test how applications perform under various thermal conditions on a device that includes thermal management. The application developers can use the tests to determine whether the application should take proactive measures to maintain application performance, and which proactive measures should be taken. For example, an application can reduce its use of resources to ensure that an application maintains a desired quality of user experience (and at a minimum remains responsive) under adverse thermal conditions. Creating adverse conditions can be difficult to replicate, costly to implement, and can potential cause damage to the electronic device being tested. In some examples, simulating thermal conditions can be used instead of placing the device in real-world adverse conditions to improve the testing process for developers.

Abstract: Thermal conditions can be simulated for an electronic device. Application developers may want to test how applications perform under various thermal conditions on a device that includes thermal management. The application developers can use the tests to determine whether the application should take proactive measures to maintain application performance, and which proactive measures should be taken. For example, an application can reduce its use of resources to ensure that an application maintains a desired quality of user experience (and at a minimum remains responsive) under adverse thermal conditions. Creating adverse conditions can be difficult to replicate, costly to implement, and can potential cause damage to the electronic device being tested. In some examples, simulating thermal conditions can be used instead of placing the device in real-world adverse conditions to improve the testing process for developers.

Abstract: An electronic device has a display with a pixel array overlapping an array of temperature sensors. Control circuitry in the device may gather temperature measurements from the temperature sensor array. The control circuitry may apply a global offset to the temperature measurements and may apply a damping factor to the globally offset measurements to produce a two-dimensional temperature profile for the display. A look-up table or other data structure may be used to store information on pixel color correction gain values as a function of temperature. This temperature-gain information and temperature information from the two-dimensional temperature profile may be used by display circuitry in the device to display color-corrected images on the display.

Abstract: An electronic device has a display with a pixel array overlapping an array of temperature sensors. Control circuitry in the device may gather temperature measurements from the temperature sensor array. The control circuitry may apply a global offset to the temperature measurements and may apply a damping factor to the globally offset measurements to produce a two-dimensional temperature profile for the display. A look-up table or other data structure may be used to store information on pixel color correction gain values as a function of temperature. This temperature-gain information and temperature information from the two-dimensional temperature profile may be used by display circuitry in the device to display color-corrected images on the display.