Abstract: A monitoring and testing apparatus for quick-connection to a fluorescent lamp assembly includes a test circuit positioned in a casing and having wire receiving clips for quick receipt and release of wires from a ballast and lamp, whereby to electrically connect the ballast and lamp. The test circuit obtains voltage data from the ballast and lamp for evaluation indicative of operability. If either voltage data is out of a predictable range, an appropriate fault is stored in memory. When a diagnostic button is depressed by a user, the test circuit evaluates the state of the memory and energizes an appropriate LED to indicate if the ballast or lamp is inoperable. The quick-connect assembly enables a novice to correctly and quickly connect a ballast or lamps to the test apparatus and to diagnose an inoperable lamp assembly.