Abstract: A scan testing technique in which test data is pipelined to scan logic within an integrated circuit. In system on a programmable chip (SOPC) designs, pipelines are easily built in the programmable logic device (PLD) logic by configuring programmable interconnects to connect registers in a pipelined manner so that test data can be pipelined to scan the logic under test. In system on a chip (SOC) designs, a smart test generator-analyzer is configured to recursively extract pipeline information from a design-so that test data can be pipelined to scan the logic under test. Generally, test data is pipelined using existing functional logic and/or scan chains. Furthermore, a failure analysis (FA) platform is described. The FA platform is operable to take as its input a failing vector as well as a pipelined scan vector and unroll the pipeline sequence to determine which vector caused the failure.