Patents by Inventor Jayakumar N. Sankarannair

Jayakumar N. Sankarannair has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11036507
    Abstract: A process for processor testing includes dividing a memory space into first and second portions and generating first and second sets of test instructions for the respective first and second portion. The first and second sets each include a plurality of counter increment/branch instruction pairs where each branch instruction of the first set branches to a backward instruction location and each branch instruction of the second set branches to a forward instruction location.
    Type: Grant
    Filed: January 29, 2020
    Date of Patent: June 15, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Publication number: 20200167159
    Abstract: A process for processor testing includes dividing a memory space into first and second portions and generating first and second sets of test instructions for the respective first and second portion. The first and second sets each include a plurality of counter increment/branch instruction pairs where each branch instruction of the first set branches to a backward instruction location and each branch instruction of the second set branches to a forward instruction location.
    Type: Application
    Filed: January 29, 2020
    Publication date: May 28, 2020
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Patent number: 10585668
    Abstract: A process for processor testing includes generating a set of test instructions having a first portion and a second portion. A first branch instruction is randomly generated for the first portion where the first branch instruction branches to a respective instruction in a second portion by a branching location offset. A second branch instruction is randomly generated for the second portion where the second branch instruction branches to a respective instruction in the first portion by the branching location offset. If additional instructions are to be added to the set of test instructions, a value of the branching location offset is incrementing by a predetermined amount.
    Type: Grant
    Filed: October 2, 2017
    Date of Patent: March 10, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Publication number: 20180024833
    Abstract: A process for processor testing includes generating a set of test instructions having a first portion and a second portion. A first branch instruction is randomly generated for the first portion where the first branch instruction branches to a respective instruction in a second portion by a branching location offset. A second branch instruction is randomly generated for the second portion where the second branch instruction branches to a respective instruction in the first portion by the branching location offset. If additional instructions are to be added to the set of test instructions, a value of the branching location offset is incrementing by a predetermined amount.
    Type: Application
    Filed: October 2, 2017
    Publication date: January 25, 2018
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Patent number: 9785439
    Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Grant
    Filed: September 3, 2014
    Date of Patent: October 10, 2017
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Publication number: 20150026445
    Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Application
    Filed: September 3, 2014
    Publication date: January 22, 2015
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Patent number: 8914622
    Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: December 16, 2014
    Assignee: International Business Machines Corporation
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Patent number: 8812826
    Abstract: In one implementation, processor testing may include the ability to randomly generate a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. Processor testing may also include the ability to randomly generate a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. Processor testing may additionally include the ability to generate a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Grant
    Filed: October 20, 2010
    Date of Patent: August 19, 2014
    Assignee: International Business Machines Corporation
    Inventors: Abhishek Bansal, Nitin Gupta, Brad L. Herold, Jayakumar N Sankarannair
  • Patent number: 8667255
    Abstract: A post-silicon testing apparatus, method, and computer program product provide for runtime coverage measurement methodology to measure the architectural events in hardware. Measurement of all architectural events discernable from the instructions and architectural state changes are tracked and recorded. A mechanism to ensure capturing of maskable events is also provided. A feedback driven test-generation approach is enabled by the runtime coverage measurement. The runtime coverage measurement system presents a live view of the comprehensive architectural event coverage to the user/tester. The methodology can be implemented on an operating system environment and also as a standalone/bare-metal tool.
    Type: Grant
    Filed: September 30, 2010
    Date of Patent: March 4, 2014
    Assignee: International Business Machines Corporation
    Inventors: Sangram Alapati, Jayakumar N Sankarannair, Varun Mallikarjunan, Prathiba Kumar, Satish Kumar Sadasivam
  • Publication number: 20120216023
    Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Application
    Filed: April 30, 2012
    Publication date: August 23, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Publication number: 20120102302
    Abstract: Processors may be tested according to various implementations. In one general implementation, a process for processor testing may include randomly generating a first plurality of branch instructions for a first portion of an instruction set, each branch instruction in the first portion branching to a respective instruction in a second portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may also include randomly generating a second plurality of branch instructions for the second portion of the instruction set, each branch instruction in the second portion branching to a respective instruction in the first portion of the instruction set, the branching of the branch instructions to the respective instructions being arranged in a sequential manner. The process may additionally include generating a plurality of instructions to increment a counter when each branch instruction is encountered during execution.
    Type: Application
    Filed: October 20, 2010
    Publication date: April 26, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Abhishek Bansal, Nitin P. Gupta, Brad L. Herold, Jayakumar N. Sankarannair
  • Publication number: 20120084538
    Abstract: A post-silicon testing apparatus, method, and computer program product provide for runtime coverage measurement methodology to measure the architectural events in hardware. Measurement of all architectural events discernable from the instructions and architectural state changes are tracked and recorded. A mechanism to ensure capturing of maskable events is also provided. A feedback driven test-generation approach is enabled by the runtime coverage measurement. The runtime coverage measurement system presents a live view of the comprehensive architectural event coverage to the user/tester. The methodology can be implemented on an operating system environment and also as a standalone/bare-metal tool.
    Type: Application
    Filed: September 30, 2010
    Publication date: April 5, 2012
    Applicant: IBM CORPORATION
    Inventors: Sangram Alapati, Jayakumar N. Sankarannair, Varun Mallikarjunan, Prathiba Kumar, Satish Kumar Sadasivam
  • Patent number: 6792514
    Abstract: A method, system, and computer program product for testing enforcement of logical partitioning in a data processing system are provided. In one embodiment, a call to an interface routine of a logical partitioning enforcement software unit is generated and sent to the logical partitioning enforcement software unit. Generating a call to an interface routine may include, for example, pseudo-randomly selecting one of a valid interface routine and an invalid interface routine and generating a call to the selected interface routine. A reply is received from the logical partitioning enforcement software unit and compared with an anticipated reply. Responsive to a discrepancy between the reply and the anticipated reply, a user is notified of a problem, thus allowing the user to take appropriate actions to correct the problem.
    Type: Grant
    Filed: June 14, 2001
    Date of Patent: September 14, 2004
    Assignee: International Business Machines Corporation
    Inventors: Shakti Kapoor, Jayakumar N. Sankarannair
  • Publication number: 20020194437
    Abstract: A method, system, and computer program product for testing enforcement of logical partitioning in a data processing system is provided. In one embodiment, a call to an interface routine of a logical partitioning enforcement software unit is generated and sent to the logical partitioning enforcement software unit. A reply is received from the logical partitioning enforcement software unit and compared with an anticipated reply. Responsive to a discrepancy between the reply and the anticipated reply, a user is notified of a problem, thus allowing the user to take appropriate actions to correct the problem.
    Type: Application
    Filed: June 14, 2001
    Publication date: December 19, 2002
    Applicant: International Business Machines Corporation
    Inventors: Shakti Kapoor, Jayakumar N. Sankarannair