Abstract: According to various embodiments, an electronic device may include at least one sensor, at least one communication circuit, and a processor electrically connected to the at least one sensor and/or the at least one communication circuit, wherein the processor is configured to determine a relay message generation condition associated with a vehicle based at least on data acquired from the at least one sensor and/or the at least one communication circuit, to generate a relay message based at least on the data acquired from the at least one sensor and/or the at least one communication circuit when the relay message generation condition is satisfied based on the determination result, and to transmit the generated relay message to an external vehicle through the at least one communication circuit.

Abstract: According to the present disclosure, a method of calculating an angle of impact of a bloodstain is performed by a device for calculating an angle of impact of a bloodstain and includes obtaining a captured image of an analysis target by using a camera, extracting a spatter stain included in the analysis target, by analyzing the obtained captured image, calculating a major axis length and a minor axis length of the spatter stain, estimating an angle of impact of the spatter stain by using the major axis length and the minor axis length of the spatter stain, and outputting the spatter stain and the angle of impact of the spatter stain.

Abstract: A temperature and humidity chamber type apparatus for taking potential impact marks according to an embodiment includes: a specimen treated with an amino acid reaction reagent to react with potential impact marks to take the potential impact marks; a chamber in which a receiving space for receiving the specimen is secured; a door for opening and closing the chamber; a supporter formed in the receiving space to receive the specimen; an adjuster for adjusting temperature and humidity in the chamber within a set application time range to take the potential impact marks; a display unit attached to one side of the outside of the chamber to display an operation state in the chamber; a power source; a controller for controlling setting of temperature, humidity, and an application time in the chamber; and an input unit in which the controller operates according to a user's input.

Abstract: A wafer measurement system for measuring a measurable characteristic of a first measurement target formed on a wafer includes: a memory and a processor. The memory is configured to store an image of the wafer, multiple templates each including at least one line, and a measurement program. The processor is accessible to the memory and is configured to execute multiple modules included in the measurement program. The modules include: a template selection module configured to receive the templates and select a measurement template corresponding to a shape of the first measurement target; a template matching module configured to match the measurement template to the first measurement target; and a measurement module configured to measure the measurable characteristic of the first measurement target based on position information of the measurement template.

Abstract: According to the present disclosure, a method of calculating a formation time of a perimeter stain is performed by a device for calculating a formation time of a perimeter stain, and includes obtaining a captured image of an analysis target by using a camera, extracting an image of a perimeter stain included in the analysis target, by analyzing the obtained captured image, calculating a major axis length and a width of the perimeter stain, estimating a formation time of the perimeter stain by using the major axis length and the width of the perimeter stain, and outputting the image of the perimeter stain and the formation time of the perimeter stain.

Abstract: According to various embodiments, an electronic device may include at least one sensor, at least one communication circuit, and a processor electrically connected to the at least one sensor and/or the at least one communication circuit, wherein the processor is configured to determine a relay message generation condition associated with a vehicle based at least on data acquired from the at least one sensor and/or the at least one communication circuit, to generate a relay message based at least on the data acquired from the at least one sensor and/or the at least one communication circuit when the relay message generation condition is satisfied based on the determination result, and to transmit the generated relay message to an external vehicle through the at least one communication circuit.

Abstract: According to an embodiment, a method of determining tool mark identity using machine learning may include: obtaining surface height data of at least two tool strip marks by photographing tool strip marks generated using at least two tools with a three-dimensional (3D) microscope; generating a data set by calculating a cross-correlation coefficient for the surface height data of the tool strip marks; separating the data set into a training set for machine learning training and a test set for verifying a machine learning result; performing the machine learning training to determine whether the tool strip marks are identical using the training set; and verifying a result of the machine learning training using the test set.

Abstract: A yield prediction apparatus is provided. The yield prediction apparatus may include at least one processor coupled to at least one non-transitory computer-readable medium. The at least one processor may be configured to receive a first variable associated with operating characteristics of a semiconductor device, perform a simulation for the operating characteristics of the semiconductor device, perform a neural network regression analysis using a result of the simulation to determine a first function for the first variable, and predict a yield of the semiconductor integrated circuit based on an advanced Monte Carlo simulation. An input of the advanced Monte Carlo simulation may include the determined first function.

Abstract: To reduce structure noise, input data representing an input structure is obtained and boundary conditions are set by classifying data of each of multiple structure elements of the input data as a signal component or a noise component. A smoothing operation is performed with respect to the input data and based on the boundary conditions. Output data representing an output structure is provided by reducing noise from the input structure.

Abstract: Provided is a blood spatter simulation head model including a housing having the shape of a human head; a reservoir inside the housing and capable of storing blood; an injection tube connected to the reservoir and extending to a lower portion of the housing, the injection tube including an injection opening through which blood is injected; and a weight unit in a lower portion of the housing and supporting the housing.

Abstract: According to the present disclosure, a method of calculating an angle of impact of a bloodstain is performed by a device for calculating an angle of impact of a bloodstain and includes obtaining a captured image of an analysis target by using a camera, extracting a spatter stain included in the analysis target, by analyzing the obtained captured image, calculating a major axis length and a minor axis length of the spatter stain, estimating an angle of impact of the spatter stain by using the major axis length and the minor axis length of the spatter stain, and outputting the spatter stain and the angle of impact of the spatter stain.

Abstract: According to the present disclosure, a method of calculating a formation time of a perimeter stain is performed by a device for calculating a formation time of a perimeter stain, and includes obtaining a captured image of an analysis target by using a camera, extracting an image of a perimeter stain included in the analysis target, by analyzing the obtained captured image, calculating a major axis length and a width of the perimeter stain, estimating a formation time of the perimeter stain by using the major axis length and the width of the perimeter stain, and outputting the image of the perimeter stain and the formation time of the perimeter stain.

Abstract: A wafer measurement system for measuring a measurable characteristic of a first measurement target formed on a wafer includes: a memory and a processor. The memory is configured to store an image of the wafer, multiple templates each including at least one line, and a measurement program. The processor is accessible to the memory and is configured to execute multiple modules included in the measurement program. The modules include: a template selection module configured to receive the templates and select a measurement template corresponding to a shape of the first measurement target; a template matching module configured to match the measurement template to the first measurement target; and a measurement module configured to measure the measurable characteristic of the first measurement target based on position information of the measurement template.

Abstract: According to various embodiments, an electronic device may include at least one sensor, at least one communication circuit, and a processor electrically connected to the at least one sensor and/or the at least one communication circuit, wherein the processor is configured to determine a relay message generation condition associated with a vehicle based at least on data acquired from the at least one sensor and/or the at least one communication circuit, to generate a relay message based at least on the data acquired from the at least one sensor and/or the at least one communication circuit when the relay message generation condition is satisfied based on the determination result, and to transmit the generated relay message to an external vehicle through the at least one communication circuit.

Abstract: A yield prediction apparatus is provided. The yield prediction apparatus may include at least one processor coupled to at least one non-transitory computer-readable medium. The at least one processor may be configured to receive a first variable associated with operating characteristics of a semiconductor device, perform a simulation for the operating characteristics of the semiconductor device, perform a neural network regression analysis using a result of the simulation to determine a first function for the first variable, and predict a yield of the semiconductor integrated circuit based on an advanced Monte Carlo simulation. An input of the advanced Monte Carlo simulation may include the determined first function.

Abstract: Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.

Abstract: A method for analyzing a wafer map using a wafer map analyzer includes generating first wafer maps each displaying characteristics of a first wafer for a corresponding channel of a plurality of channels. The first wafer maps are auto-encoded together to extract a first feature. The method also includes determining whether the first feature is a valid pattern, classifying the type of the first feature based on unsupervised learning when the first feature is a valid pattern and extracting a representative image of features classified into the same type as the first feature.

Abstract: An electronic device may include: a housing; a display exposed through the housing; a wireless communication circuit located within the housing; a processor located within the housing and operably connected to the display and the wireless communication circuit; and a memory located within the housing and operably connected to the processor, wherein the memory may store instructions to cause the processor, when executed, to switch a plurality of states related to all or one of transmission/reception of both a first signal and a second signal and transmission/reception of one thereof, the first signal includes information generated at least partially based on a state of the electronic device, the second signal includes information generated at least partially based on a state of a vehicle, and the plurality of states includes a first state, a second state, a third state, and a fourth state. Various other embodiments are possible.

Abstract: An electronic device includes at least one communication circuit, and a processor electrically connected with the at least one communication circuit. The processor may be configured to select an external electronic device in response to a user input, broadcast, through the at least one communication circuit using a first protocol, a connection request for a second protocol-based communication with the external electronic device, receive a response to the connection request from the external electronic device through the at least one communication circuit, and perform communication with the external electronic device through the at least one communication circuit using a second protocol, based on connection information about the external electronic device for the second protocol-based communication, the connection information being contained in the response.

Abstract: A thickness of a first layer in a structure may be measured based on an original image of the structure. A first boundary of the first layer may be identified in the original image. A second boundary that is substantially indistinguishable in the original image may be identified based on converting the original image into a first image based on the first boundary and generating a second image based on filtering the first image. The first image may be generated based on adjusting partial image portions of the original image to align the representation of the first boundary with an axis line, such that the first image includes a representation of the first boundary that extends substantially in parallel with the axis line. The second boundary may be identified from the second image, and the thickness of the layer may be determined based on the identified first and second boundaries.