Abstract: Apparatus for testing a device by delivering an electrostatic discharge signal to one or more device terminals, comprising a first part configured for mechanically mounting the device and comprising one or more first part connectors for electrically coupling to the one or more device terminals and thus providing electrical access to the one or more device terminals, a second part comprising one or more second part connectors configured for electrically coupling the one or more first part connectors to the one or more second part connectors for testing the device via the second part connectors, and a guide arranged for mechanically moving the first part relative to the second part. The guide is configured to physically disconnect the one or more first part connectors from the one or more second part connectors while the electrostatic discharge signal is delivered to the one or more device terminals.

Abstract: The invention provides a test board support platform for supporting a test board during tests, the platform comprising a heat conductive interface arranged to contact a bottom side of the test board at a first side of the heat conductive interface. The support platform also comprises a thermal conditioner coupled to a second side of the heat conductive interface, the second side being opposite the first side. By using this test board support platform a test board can be supported and thermally controlled in a way so that a DUT positioned on the test board can be probed from above, while the temperature is controlled from below.

Abstract: Apparatus for testing a device by delivering an electrostatic discharge signal to one or more device terminals, comprising a first part configured for mechanically mounting the device and comprising one or more first part connectors for electrically coupling to the one or more device terminals and thus providing electrical access to the one or more device terminals, a second part comprising one or more second part connectors configured for electrically coupling the one or more first part connectors to the one or more second part connectors for testing the device via the second part connectors, and a guide arranged for mechanically moving the first part relative to the second part. The guide is configured to physically disconnect the one or more first part connectors from the one or more second part connectors while the electrostatic discharge signal is delivered to the one or more device terminals.

Abstract: The invention provides a test board support platform for supporting a test board during tests, the platform comprising a heat conductive interface arranged to contact a bottom side of the test board at a first side of the heat conductive interface. The support platform also comprises a thermal conditioner coupled to a second side of the heat conductive interface, the second side being opposite the first side. By using this test board support platform a test board can be supported and thermally controlled in a way so that a DUT positioned on the test board can be probed from above, while the temperature is controlled from below.