Abstract: A device for low temperature bend-testing of a test piece is disclosed. The device of the present invention comprises fixed and movable units. The fixed unit includes a base which includes at least one substantially vertical stanchion. A tank for holding a volume of low temperature liquid, such as liquid nitrogen, is secured to the base. The movable unit includes a support and a pin. The support structure includes an arch portion and at least one projection. The test piece under test is supported by supports included in the arch portion. The pin is slidably mounted in the structure so as to be displaceable in a direction perpendicular to the test piece when supported by the supports. The device also includes means making the fixed and movable units operable together to permit the test piece to be bend-tested in the tank.