Patents by Inventor Jean-Fran.cedilla.ois Piquard

Jean-Fran.cedilla.ois Piquard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5606410
    Abstract: A method and apparatus for checking the surface state of one face (2) of a solid (1) in order to locate shape defects which may be present therein. The observation of the face to be checked takes place by means of photography using a large field video camera (3) and a small field video camera (4). The size of the located defects is measured by an optoelectronic sensor or probe (11). The apparatus can be controlled by an operator or can have automatic control.
    Type: Grant
    Filed: July 26, 1995
    Date of Patent: February 25, 1997
    Assignee: Compagnie Generale des Matieres Nucleaires
    Inventors: Roger Peclier, Pierre Laurent, Jean-Fran.cedilla.ois Piquard