Abstract: A measurement system and an inspection method for detecting a defective bonding interface in a sample substrate including at least one element disposed on a support. The method comprises: placing the sample substrate in the measurement system, establishing an inclination map of the exposed surface, analyzing the inclination map and identifying a zone or zones of the exposed surface whose inclinations deviate by more than a given threshold from the inclination of the reference surface; and detecting the presence of a defective bond between the element and the support, depending on the result of the analysis of the inclination map.

Abstract: A method and related system for measuring a surface of a substrate including at least one structure using low coherence optical interferometry, the method being implemented with a system having an interferometric device, a light source, an imaging sensor, and a processing module, the method including: - acquiring, with the imaging sensor, an interferometric signal formed by the interferometric device between a reference beam and a measurement beam reflected by the surface at a plurality of measurement points in a field of view; the following steps being carried out by the processing module: classifying, by a learning technique, the acquired interferometric signals according to a plurality of classes, each class being associated with a reference interferometric signal representative of a typical structure; and analysing the interferometric signals to derive information on the structure at the measurement points, as a function of the class of each interferometric signal.

Abstract: A method and related system for measuring a surface of a substrate including at least one structure using low coherence optical interferometry, the method being implemented with a system having an interferometric device, a light source, an imaging sensor, and a processing module, and including: —acquiring, with the imaging sensor, an interferometric signal formed by the interferometric device between a reference beam and a measurement beam reflected by the surface at a plurality of measurement points in a field of view; the following steps being carried out by the processing module: classifying, by a learning technique, the acquired interferometric signals according to a plurality of classes, each class being associated with a reference interferometric signal representative of a typical structure; and analysing the interferometric signals to derive therefrom information on the structure at the measurement points, as a function of the class of each interferometric signal.

Abstract: A method for measuring a surface of an object including at least one structure using low coherence optical interferometry, the method including the steps of acquiring an interferometric signal at a plurality of measurement points in a field of view and, for at least one measurement point, attributing the interferometric signal acquired to a class of interferometric signals from a plurality of classes, each of the classes being associated with a reference interferometric signal representative of a typical structure; and analysing the interferometric signal to derive therefrom an item of information on the structure at the measurement point, as a function of its class.

Abstract: A method and related device for measuring the profile of a surface of an object to be measured having zones made from at least two different materials, the object to be measured forming part of a plurality of substantially identical objects, the plurality of objects also including at least one reference object having at least one reference surface, the method including the following steps: determining a correction function, from a first profile signal of a first reference surface and a second profile signal from a second reference surface, the second reference surface being metallized; acquiring a profile signal from the surface of the object to be measured; and applying the correction function to the profile signal from the surface of the object to be measured to obtain a corrected profile signal; the profile signals being obtained from interferometric measurements.

Abstract: A method for measuring a surface of an object including at least one structure using low coherence optical interferometry, the method including the following steps: acquiring an interferometric signal at a plurality of points, called measurement points, of the surface in a field of view; for at least one measurement point: attributing the interferometric signal acquired to a class of interferometric signals from a plurality of classes, each class being associated with a reference interferometric signal representative of a typical structure; and analysing the interferometric signal to derive therefrom an item of information on the structure at the measurement point, as a function of its class. A measuring system implementing the present method is also provided.

Abstract: A method and related device for measuring the profile of a surface of an object to be measured having zones made from at least two different materials, the object to be measured forming part of a plurality of substantially identical objects, the plurality of objects also including at least one reference object having at least one reference surface, the method including the following steps: determining a correction function, from a first profile signal of a first reference surface and a second profile signal from a second reference surface, the second reference surface being metallized; acquiring a profile signal from the surface of the object to be measured; and applying the correction function to the profile signal from the surface of the object to be measured to obtain a corrected profile signal; the profile signals being obtained from interferometric measurements.

Abstract: A method for the inspection and measurement of a face of an object having at least two surfaces staggered depthwise with respect to one another, the surfaces forming in particular a step or a trench on/in the face, the method including the following steps: measuring an interferometric signal, called measured signal, at several points, called measurement points, of the inspected face; for at least one measurement point, extracting the measured signal relative to at least one, in particular to each, surface, the extraction providing for the measurement point an interferometric signal, called individual signal, for the surface; profilometric analysis of the individual signals, independently for each surface. Also included is a system for the inspection and measurement of a face of an object implementing such a method.

Abstract: The invention relates to a method for detecting fraud to authenticate that an object is a human finger from a three-dimensional representation of said object comprising a set of representation points (3) modeling at least a part of the surface of the object, comprising the following steps: a) determining at least one principal plane (P) comprising a principal axis in the longitudinal direction of the three-dimensional representation of the object, said principal plane (P) intersecting the representation (1) of the surface of the object along at least one intersection zone, b) for each principal plane (P), determining a set of working points (5) from representation points (3) at the intersection zone, c) validation that the object is a human finger by implementing a validation process on the position of the working points.

Abstract: A method for detecting fraud to authenticate a finger The invention relates to a method for detecting fraud to authenticate that an object is a human finger from a three-dimensional representation of said object comprising a set of representation points (3) modeling at least a part of the surface of the object, comprising the following steps: a) determining at least one principal plane (P) comprising a principal axis in the longitudinal direction of the three-dimensional representation of the object, said principal plane (P) intersecting the representation (1) of the surface of the object along at least one intersection zone, b) for each principal plane (P), determining a set of working points (5) from representation points (3) at the intersection zone, c) validation that the object is a human finger by implementing a validation process on the position of the working points.

Abstract: Validation of using a finger as support of a fingerprint may include: placing the support such that it bears; capturing a captured image of the print; transforming the captured image into a resulting image by passage through a low-pass filter; locating on the resulting image an origin point, the intensity of whose pixel is representative of the maximum pressure exerted on the support; verifying that, on the resulting image, for a plurality of radii issuing from the origin point, and for each of said radii, for a plurality of points M, the intensity of the pixel of each point M of said radius is representative of a decline in the pressure exerted on the support as the distance from the origin point to the point M increases, and a decision as regards the validity of the support is taken as a function of the results of the verification step.

Abstract: Validation of using a finger as support of a fingerprint may include: placing the support such that it bears; capturing a captured image of the print; transforming the captured image into a resulting image by passage through a low-pass filter; locating on the resulting image an origin point, the intensity of whose pixel is representative of the maximum pressure exerted on the support; verifying that, on the resulting image, for a plurality of radii issuing from the origin point, and for each of said radii, for a plurality of points M, the intensity of the pixel of each point M of said radius is representative of a decline in the pressure exerted on the support as the distance from the origin point to the point M increases, and a decision as regards the validity of the support is taken as a function of the results of the verification step.

Abstract: A method for following an object in a sequence of at least two images, termed previous and current, comprises a step of forming a first set Ep of points E p={Pp(1), . . . , Pp(i), . . . , Pp(N)} by extracting N characteristic points Pp(i) of the object present in the previous image and of forming a second set Ec of points Ec={Pc(1), . . . , Pc(i), . . . , Pc(M)} by extracting M characteristic points Pc(j) of the object present in the current image. The method further comprises a step of estimating the parameters of a model of movement of the object between the two images on the basis of pairs of matched points thus formed, and a step of selecting the pairs of matched points used to estimate the parameters of the movement model. The pairs of matched points may be selected solely from among those which are related to points of the first set of points which are singular.

Abstract: The present invention relates to a method for following an object in a sequence of at least two images termed previous and current. The said method comprises a step for forming a first set Ep of points Ep={Pp(1), . . . , Pp(i), . . . , Pp(N)} by extracting N characteristic points Pp(i) of the object present in the previous image and for forming a second set Ec of points Ec={Pc(1), . . . , Pc(i), . . . , Pc(M)} by extracting M characteristic points Pc(j) of the object present in the current image, a step for estimating the parameters of a model of movement of the object between the two images on the basis of pairs of matched points thus formed, and a step of selecting the pairs of matched points used to estimate the parameters of the movement model, in the course of which said pairs of matched points are selected solely from among those which are related to points of the first set of points which are singular, each point of the first set of points being a singular point.