Abstract: The invention relates to a device for the measurement of the thickness profile of a metal product in the form of a moving strip or a moving plate, of the type composed of an X-ray source emitting in the direction of the said product, an X-ray detection unit (21) located on the other side of the product with respect to the said source, means (22) for processing the signals emitted by the detection unit enabling the thickness profile of the said product to be measured, and means (23, 24) for cooling the detection unit and means for processing its signals, wherein the detection unit and the means for processing its signals are arranged on a support plate (18) fitted with a closure plate (19), the closure plate including electrical (27) and fluid (25, 26) connections necessary for the operation of the detection unit and of the means for processing its signals, in that the support plate is inserted into a box of which one of the side faces has an opening, means (20) for the attachment of the closure plate and mean

Abstract: The device of the invention calibrates an apparatus for measuring the thickness profile of flat products, for example metal sheets, of the type which includes a source (10) of radiation, for example an X-ray source, and a row (20) of elementary detectors (21) which are aligned along the direction (P) of the profile to be measured and are placed on either side of a zone (2) for passage of said product. The device includes a set (32) of shims (33) having different radiation absorption characteristics, a carriage (30) for supporting the shims which is movable along the direction (P). For the calibration, the set of shims is moved in the passage zone so that each shim may intercept the radiation emitted by the source in the direction of each detector.