Patents by Inventor Jean-Luc Delcari

Jean-Luc Delcari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090051930
    Abstract: A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a sequence of at least three images of the pattern reflected by the substrate to a sensor, the images corresponding to displacement of the fringes of the pattern, determination of the gradient of the surface of the substrate using displacements of fringes of the pattern, and determination of the presence of a surface defect on the substrate using variations in the gradient of the surface of the substrate. Another embodiment comprises a device using said method.
    Type: Application
    Filed: March 27, 2008
    Publication date: February 26, 2009
    Applicants: S.O.I. TEC SILICON ON INSULATOR TECHNOLOGIES, ALTATECH SEMICONDUCTOR
    Inventors: Cecile Moulin, Sophie Moritz, Philippe Gastaldo, Francois Berger, Jean-Luc Delcari, Patrice Belin
  • Patent number: D727842
    Type: Grant
    Filed: January 31, 2013
    Date of Patent: April 28, 2015
    Assignee: Soitec Solar GmbH
    Inventors: Antoine Auberton-Herve, Jean-Luc Delcari, Gilles Du Sordet