Abstract: Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

Abstract: Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

Abstract: Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

Abstract: Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

Abstract: A method of enhancing spectral data such as a frequency, wavelength or mass spectrum comprises applying an inverse Fourier Transform to the data in the frequency, wavelength or mass spectrum, zero-filling and, optionally, apodizing that inverse transform data, and then applying a Fourier Transform to convert the inverse data back into the frequency, wavelength or mass domain. The resultant processed spectrum provides a more accurate indication of peak location, shape and height.

Abstract: Frequency-modulated "chirp" pulses for exciting multiple-quantum coherences over large bandwidths can be considered as an alternative to composite pulses to combat the effects of large offsets and tilted effective fields. Refocusing of the phase dispersion of double-quantum coherence can be combined with suitable detection sequences to yield pure absorption two-dimensional double-quantum spectra. The method of symmetrical excitation and detection by time-reversal may be applied to obtain t.sub.1 -modulated longitudinal magnetization, which may then be converted into observable single-quantum coherence by a chirp echo sequence. Similar approaches can be used for many other NMR experiments involving coherence transfer.

Abstract: In NMR pulse experiments transverse magnetization is excited by irradiating the nuclear spin system with a two pulse sequence of a first RF chirp pulse and a second RF chirp pulse, generated after a defocusing time interval .tau.. The pulse duration of the second chirp pulse is half the duration of the first pulse, and the amplitude of the second chirp pulse is approximately three times the amplitude of the first chirp pulse. The first pulse being a 90.degree.-pulse, the second pulse being a 180.degree.-pulse, a refocusing of the magnetization vectors occurs at a time .tau.'=.tau.+.tau.180.degree. after elapse of the second chirp pulse, and acquisition of the resulting echo signal is started at peak of the echo.