Abstract: A portable two-mode probe intended to be applied against a biological tissue to be examined, the probe comprising: an ultrasonic transducer (34, 63), configured to emit ultrasonic waves into the tissue and to receive ultrasonic waves reflected by the tissue, the transducer extending along a transverse axis; at least two optodes (32, 60, 62a, 62b) placed on either side of the transverse axis, such that the transducer extends between the two optodes; each optode comprising a casing (52, 61), the casing containing: a light emitter (31), configured to emit a light wave toward the tissue; and/or an optical detector (32), configured to detect a light wave scattered by the tissue; the optodes being arranged such that at least one light emitter and at least one optical detector are placed on either side of the transducer; at least one optical detector having a detection area (53, 63a, 63b) formed from a semiconductor and connected to a circuit board (54).

Abstract: A method for characterizing a particle present in a sample, the sample lying between an image sensor and a light source and the sensor lying in a detection plane, includes illuminating the sample with the light source which emits an incident light wave propagating along a propagation axis, and acquiring an image of the sample with the sensor. The sensor is exposed to an exposure light wave. The image includes a plurality of elementary diffraction patterns each corresponding to one particle. The method also includes reconstructing a complex image representative of a complex amplitude of the light wave on a reconstruction surface passing through the sample, based on the acquired image; selecting a region of interest of the complex image corresponding to a particle of interest; forming an extracted image based on the region of interest; and characterizing the particle of interest depending on the extracted region of interest.

Abstract: Determining an optical property of a sample having an illumination of a surface of the sample with the aid of a light beam, so as to form, on the surface of the said sample, an elementary illumination zone, corresponding to the part of the said surface illuminated by the said sample. A detection of N optical signals, backscattered by the sample, each optical signal emanating from the surface of the sample at a distance, termed the backscattering distance, from the said elementary illumination zone, N being an integer greater than or equal to 1, so as to form as many detected signals. A determination of at least one optical property of the sample, by comparison between: a function of each signal thus detected and a plurality of estimations of the said function each estimation being carried out by considering a predetermined value of the said optical property, characterized in that during the said detection step, at least one backscattering distance is less than 200 pm.

Abstract: A method correcting a measured spectrum of X radiation, according to a number of channels Nc, each channel i corresponding to an energy range between Ei and Ei+?Ei, including: determining function ?ti,j(k) determining size of temporal deviation ?t interval separating two interactions with energy Ei and Ej, stacking of which leads to a detected energy value Ek; determining, from the function ?ti,j(k), probability function Pi,j(k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Ei and Ej; determining, from the probability function Pi,j(k), a stack spectrum as a part of the measured spectrum that corresponds only to the stacks alone; and calculating or estimating at least a first corrected spectrum, by the difference between the measured spectrum and the stack spectrum.

Abstract: The invention relates to a method for correcting an optical signal produced by a sample comprising the following steps: illuminating a surface of the sample by a first light beam, produced by a first light source, the said first light source being coupled to a first optical system, focusing the said first light beam in an object focal plane of the first optical system, the said object focal plane being situated, in the sample, at a measuring depth z from the surface of the sample; measuring, with a first photodetector, of a first optical signal backscattered by the sample in response to the first light beam, the first photodetector producing a first measured signal representative of the said first optical signal, a spatial filter being interposed between the first optical system and the first photodetector, the spatial filter comprising a window which transmits the said first optical signal towards the said first photodetector, the window being disposed in a conjugate focal plane of the object focal plane

Abstract: The invention relates to a method for correcting an optical signal produced by a sample comprising the following steps: illuminating a surface of the sample by a first light beam, produced by a first light source, the said first light source being coupled to a first optical system, focusing the said first light beam in an object focal plane of the first optical system, the said object focal plane being situated, in the sample, at a measuring depth z from the surface of the sample; measuring, with a first photodetector, of a first optical signal backscattered by the sample in response to the first light beam, the first photodetector producing a first measured signal representative of the said first optical signal, a spatial filter being interposed between the first optical system and the first photodetector, the spatial filter comprising a window which transmits the said first optical signal towards the said first photodetector, the window being disposed in a conjugate focal plane of the object focal plane

Abstract: The invention relates to a method for determining an optical property of a sample, comprising the following steps: illumination of a surface of the sample with the aid of a light beam, so as to form, on the surface of the said sample, an elementary illumination zone, corresponding to the part of the said surface illuminated by the said sample; detection of N optical signals, backscattered by the sample, each optical signal emanating from the surface of the sample at a distance, termed the backscattering distance, from the said elementary illumination zone, N being an integer greater than or equal to 1, so as to form as many detected signals; determination of at least one optical property of the sample, by comparison between: a function of each signal thus detected; and a plurality of estimations of the said function each estimation being carried out by considering a predetermined value of the said optical property, the method being characterized in that during the said detection step, at least one b

Abstract: A system for reconstructing optical properties of a diffusing medium including at least one pulsed radiation source capable of illuminating the diffusing medium, at least one first detector of a first type, capable of receiving a signal emitted by the medium, the first detector being a time-resolved detector, and an information processing unit for processing at least one source—first detector pair, a time distribution of the signal received by the corresponding first detector. The reconstruction system also includes at least one second detector of a second type, each second detector being made up of a set of pixel(s) from an image sensor capable of acquiring an image of the medium, and the second detector being capable of measuring an intensity of the signal emitted by the medium, the intensity corresponding to an equivalent moment of order 0 for the corresponding source—second detector pair.

Abstract: A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.

Abstract: The invention relates to a device for identifying a material of an object having a source of X-Ray photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume (?V) of the material and an energy of the X-Ray photons of the backscattered beam. The incident and backscattered beams forming a scattering angle (?). An adjusting device adjusts the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle. A processing device processes the two magnitudes in two positions and the energy in one position and calculates an attenuation coefficient (?material (E0, E1, ?)). An estimating device estimates the density (?) of the material.

Abstract: A method for locating at least one optical marker in a diffusing medium, the marker having at least one optical property different from the diffusing medium, wherein: a) a pulsed radiation interacts with the medium and the at least one optical marker, producing an optical signal, and at least one acquisition of data of the optical signal is performed, each acquisition including one or more time components of interest, due to the at least one marker, and a spurious component, due to the medium other than the at least one marker, b) a multidimensional array X is formed from the optical signal data of the at least one of the acquisitions, c) the array X is processed by factorization into a product of only two non-negative multidimensional arrays A and S, and d) at least one of the time components is extracted from the arrays A and S.

Abstract: The system according to the invention for reconstructing optical properties of a diffusing medium, the reconstruction system comprises: at least one pulsed radiation source capable of illuminating the diffusing medium, at least one first detector of a first type, capable of receiving a signal emitted by the medium, the or each first detector being a time-resolved detector, and means for processing, for at least one source—first detector pair, a time distribution of the signal received by the corresponding first detector. The reconstruction system also comprises at least one second detector of a second type distinct from the first type, the or each second detector being made up of a set of pixel(s) from an image sensor capable of acquiring an image of the medium, and the or each second detector is capable of measuring an intensity of the signal emitted by the medium, said intensity corresponding to an equivalent moment of order 0 for the corresponding source—second detector pair.

Abstract: A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.

Abstract: A method correcting a measured spectrum of X radiation, according to a number of channels Nc, each channel i corresponding to an energy range between Ei and Ei+?Ei, including: determining function ?ti,j(k) determining size of temporal deviation ?t interval separating two interactions with energy Ei and Ej, stacking of which leads to a detected energy value Ek; determining, from the function ?ti,j(k), probability function Pi,j(k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Ei and Ej; determining, from the probability function Pi,j(k), a stack spectrum as a part of the measured spectrum that corresponds only to the stacks alone; and calculating or estimating at least a first corrected spectrum, by the difference between the measured spectrum and the stack spectrum.

Abstract: The invention relates to a method of localising a fluorophore (22) in a scattering medium (20), by means of a radiation source (8, 10) suited to emitting an excitation radiation of this fluorophore and detection means (4, 12) suited to measuring a fluorescence signal (?fluo) emitted by this fluorophore (22) comprising: a) for at least 3 different pairs of positions of the radiation source and detection means, an excitation by a radiation coming from the radiation source (8), and a detection by means (4) of detecting the fluorescence signal emitted by this fluorophore after this excitation, b) for each of these pairs, the identification of a surface on which the fluorophore is situated, or a volume comprising this surface and in which the fluorophore is situated, c) an estimation of the localisation of the fluorophore in its surrounding medium, by calculation of the intersection of the three surfaces, or if necessary a volume around this intersection.

Abstract: The invention concerns a method for locating at least one absorber in a diffusing medium, using at least one excitation radiation and at least one detector (?fluo), including: a) for at least one pair (radiation source-detector), at least one excitation by the radiation source, and at least one detection of the fluorescence signal emitted by the absorber after this excitation, b) identification of meshing of the volume into mesh elements, and c) estimation of the location of the absorber in its diffusing medium, by computing a function (Pm) of at least one of three parameters.

Abstract: The invention concerns a method for locating at least one absorber in a diffusing medium, using at least one excitation radiation and at least one detector (?fluo), including: a) for at least one pair (radiation source-detector), at least one excitation by the radiation source, and at least one detection of the fluorescence signal emitted by the absorber after this excitation, b) identification of meshing of the volume into mesh elements, and c) estimation of the location of the absorber in its diffusing medium, by computing a function (Pm) of at least one of three parameters.

Abstract: A method is disclosed for locating at least one optical marker in a diffusing medium, said marker having at least one optical property different from the diffusing medium, method wherein: a) a pulsed radiation interacts with said medium and said at least one optical marker, producing an optical signal, and at least one acquisition of data of said optical signal is performed, each acquisition including one or more time components of interest, due to said at least one marker, and a spurious component, due to said medium other than said at least one marker, b) a multidimensional array X is formed from said optical signal data of said at least one of said acquisitions, c) said array X is processed by factorization into a product of only two non-negative multidimensional arrays A and S, d) at least one of said time components is extracted from said arrays A and S.

Abstract: The invention concerns a method for locating at least one fluorophore or at least one absorber in a diffusing medium, using at least one excitation radiation and at least one fluorescence detector (?fluo), comprising: a) for at least one pair (radiation source-detector), at least one excitation by the radiation source, and at least one detection of the fluorescence signal emitted by the fluorophore after this excitation, b) identification of meshing of the volume into mesh elements, c) estimation of the location of the fluorophore or absorber in its diffusing medium, by computing a function (Pm) of at least one of three parameters.

Abstract: A device for identifying a material of an object including: a source of X photons, and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming a scattering angle. Further, a mechanism adjusts position between the source, the detector, and the object for volume to be at different depths with a constant angle, and a mechanism processes the two magnitudes in two positions and the energy in one position to calculate an attenuation coefficient for estimating the density of the material.