Abstract: A method for inspecting cargo with is disclosed. The method includes scanning the cargo with a matrix including at least two rows of detectors, wherein each zone of the cargo irradiated by a first X ray pulse is irradiated by at least one second X ray pulse, and a radiation corresponding to the first X ray pulse is detected by a first row of the matrix, and a radiation corresponding to the at least one second pulse is detected by at least one second row of the matrix, generating a first image of the cargo and at least one second image of the cargo, determining, for each zone of the cargo irradiated, a local mutual parasitic displacement between the cargo and the matrix, determining a total mutual parasitic displacement, and generating a corrected image of the cargo without the mutual parasitic displacement.

Abstract: In one example, there is provided a matrix of detectors configured to be used in a system for inspecting cargo using inspection radiation. The matrix includes a plurality of columns of detector modules, the detector modules of each column extending along a substantially longitudinal direction, each detector module including a surface configured to receive the inspection radiation, and the plurality of columns of detector modules being adjacent to each other in a lateral direction substantially perpendicular to the longitudinal direction and substantially parallel to the surfaces of the detector modules, wherein the plurality of columns of detector modules includes at least two columns of detector modules being offset with respect to each other in an in-depth direction substantially perpendicular to both the lateral direction and the longitudinal direction.

Abstract: A method for inspecting cargo with is disclosed. The method includes scanning the cargo with a matrix including at least two rows of detectors, wherein each zone of the cargo irradiated by a first X ray pulse is irradiated by at least one second X ray pulse, and a radiation corresponding to the first X ray pulse is detected by a first row of the matrix, and a radiation corresponding to the at least one second pulse is detected by at least one second row of the matrix, generating a first image of the cargo and at least one second image of the cargo, determining, for each zone of the cargo irradiated, a local mutual parasitic displacement between the cargo and the matrix, determining a total mutual parasitic displacement, and generating a corrected image of the cargo without the mutual parasitic displacement.

Abstract: In one embodiment, there is provided detector for an inspection system, including at least one first scintillator configured to, in response to interaction with a pulse of inspection radiation, re-emit first light in a first wavelength domain, at least one second scintillator configured to, in response to interaction with the pulse of inspection radiation, re-emit second light in a second wavelength domain different from the first wavelength domain, and at least one first sensor configured to measure the first light and the second light.

Abstract: A method for inspecting cargo with is disclosed. The method includes scanning the cargo with a matrix including at least two rows of detectors, wherein each zone of the cargo irradiated by a first X ray pulse is irradiated by at least one second X ray pulse, and a radiation corresponding to the first X ray pulse is detected by a first row of the matrix, and a radiation corresponding to the at least one second pulse is detected by at least one second row of the matrix, generating a first image of the cargo and at least one second image of the cargo, determining, for each zone of the cargo irradiated, a local mutual parasitic displacement between the cargo and the matrix, determining a total mutual parasitic displacement, and generating a corrected image of the cargo without the mutual parasitic displacement.

Abstract: In one embodiment, there is provided detector for an inspection system, including at least one first scintillator configured to, in response to interaction with a pulse of inspection radiation, re-emit first light in a first wavelength domain, at least one second scintillator configured to, in response to interaction with the pulse of inspection radiation, re-emit second light in a second wavelength domain different from the first wavelength domain, and at least one first sensor configured to measure the first light and the second light.

Abstract: Method for detecting, in a load (2), the presence of objects suspected of containing at least one material having a given atomic weight, in which the load (2) is exposed to at least a first X-ray beam having a first spectrum and an atomic number class to which the materials, including the load through which the X-rays pass, is determined by high-energy discrimination. Furthermore, at least one g-ray or neutron beam spontaneously emitted by the load is measured, a spontaneous g and/or neutron radiation emission class of the material including the load is determined from the spontaneous radiation measurement, and a class of interest of the material of the load is determined from the atomic number class and the spontaneous radiation class that were determined.