Abstract: A power supply device for an installation for testing electronic components. The power supply device includes a first, high-frequency, supply source, a second, low-frequency, supply source, and a control module. The first, high-frequency, supply source includes a high-frequency amplification stage capable of outputting a first current (i1) for a first time interval. The second, low-frequency, supply source has a low-frequency amplification stage capable of outputting a second current (i2) for a second time interval, the second time interval being longer than the first time interval. The control module is adapted to selectively activate either the first source and then the second source, thereby outputting a current of the order of i1 for a time interval greater than the first time interval or only the first source, thereby outputting a current of the order of i1 for a time interval less than or equal to the first time interval. The control module responds to the needs of an electronic component under test.

Abstract: The invention relates to installations for testing components, particularly electronic chips having a permanently-increasing performance, especially in terms of current supported over long periods. In order to perform said tests correctly, the invention provides for a device that can deliver currents of up to and of the order of 200 A in a few microseconds. For this purpose, the device comprises a time-dependent power chopper (PWM) linked to a high-frequency linear amplifier (HFLA).

Abstract: Conformance testing apparatus for testing the consumption of an electronic component in a testing machine. The apparatus includes a power supply circuit having current-measuring circuitry for measuring the current taken, a test sequencer, and a measurement sequencer in which each row contains a measurement flag representative of a command to perform or not to perform a current measurement. The measurement sequencer includes a multiple acquisition memory in which each acquisition row corresponds to a row of the measurement sequence whose measurement flag is positive. The memory includes, for each acquisition row, at least one limit value zone in which a limit value for the current is written, and at least one conformance zone in which a conformance flag is written representative of the result of a comparison between the current as measured and the limit value.

Abstract: Power supply circuit of an electronic component in a test machine and intended to provide the component with a supply current in a given range under a nominal polarization voltage. The power supply circuit includes two identical elementary circuits each able to provide a supply current in half the given range on respective output terminals thereof which are connected in parallel. The elementary circuits each include a regulation circuit for maintaining on the electronic component a polarization voltage equal to the nominal polarization voltage, and a power circuit which is controlled by the regulation circuit to provide the supply current in half the given range. The regulation circuit of a first elementary circuit also controls the power circuit of the second elementary circuit, the power circuit of the second circuit being disconnected from the regulation circuit of the second elementary circuit.