Patents by Inventor Jean Perruc

Jean Perruc has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Indicator for determining the sensitivity of a radiological defect testing device
    Patent number: 4669104
    Abstract: An indicator for determining the sensitivity of a radiological defect testing device which simulates plane defects within a workpiece. Two or more tapered elements are placed side by side on a support such that parallel, adjacent sides define the plane defects. The elements are oriented such that the plane defect extends generally parallel to the direction of the radiation.
    Type: Grant
    Filed: November 14, 1985
    Date of Patent: May 26, 1987
    Assignee: Societe Nationale d'Etude et de Construction de Meteur d'Aviation-"S.N.E. C.M.A."
    Inventors: Gerard Y. Mangenet, Jean Perruc, Jean F. Vaerman