Patents by Inventor Jean-Philippe M. Bouchaud

Jean-Philippe M. Bouchaud has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6857097
    Abstract: A method evaluates an error-correcting code for a data block of a finite size. An error-correcting code is defined by a parity check matrix, wherein columns represent variable bits and rows represent parity bits. The parity check matrix is represented as a bipartite graph. A single node in the bipartite graph is iteratively renormalized until the number of nodes in the bipartite graph is less than a predetermine threshold. During the iterative renormalization, a particular variable node is selected as a target node, and a distance between the target node and every other node in the bipartite graph is measured. Then, if there is at least one leaf variable node, renormalize the leaf variable node farthest from the target node, otherwise, renormalize a leaf check node farthest from the target node, and otherwise renormalize a variable node farthest from the target node and having fewest directly connected check nodes.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: February 15, 2005
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Jonathan S. Yedidia, Jean-Philippe M. Bouchaud
  • Publication number: 20030014717
    Abstract: A method evaluates an error-correcting code for a data block of a finite size. An error-correcting code is defined by a parity check matrix, wherein columns represent variable bits and rows represent parity bits. The parity check matrix is represented as a bipartite graph. A single node in the bipartite graph is iteratively renormalized until the number of nodes in the bipartite graph is less than a predetermine threshold. During the iterative renormalization, a particular variable node is selected as a target node, and a distance between the target node and every other node in the bipartite graph is measured. Then, if there is at least one leaf variable node, renormalize the leaf variable node farthest from the target node, otherwise, renormalize a leaf check node farthest from the target node, and otherwise renormalize a variable node farthest from the target node and having fewest directly connected check nodes.
    Type: Application
    Filed: May 16, 2001
    Publication date: January 16, 2003
    Applicant: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Jonathan S. Yedidia, Jean-Philippe M. Bouchaud