Abstract: A semiconductor memory device can reduce a circuit area necessary for row repair. The semiconductor memory device includes a plurality of memory banks, a plurality of cell arrays arranged in each of the memory banks, a plurality of array word lines arranged in each of the cell arrays, one or more repair word lines arranged in each of the cell arrays, and a plurality of repair information storages configured to store bank information and row addresses of the array word lines to be replaced with the repair word lines.

Abstract: Disclosed is a semiconductor memory apparatus capable of improving precharge performance. The semiconductor memory apparatus includes a plurality of memory banks, data input/output lines commonly connected to the memory banks, and a plurality of precharge circuit units connected to the data input/output lines and aligned in an extension direction of the data input/output lines while being spaced apart from each other by a predetermined distance.

Abstract: A semiconductor memory device can reduce a circuit area necessary for row repair. The semiconductor memory device includes a plurality of memory banks, a plurality of cell arrays arranged in each of the memory banks, a plurality of array word lines arranged in each of the cell arrays, one or more repair word lines arranged in each of the cell arrays, and a plurality of repair information storages configured to store bank information and row addresses of the array word lines to be replaced with the repair word lines.

Abstract: A write driving circuit includes a plurality of driving units that write data corresponding to detection signals on memory banks, and at least one detecting unit that detects data input from the outside, and outputs the detection signals to two or more driving units among the plurality of driving units.

Abstract: A semiconductor memory device includes a first plurality of banks arranged in a first direction to form a first group of banks; a second plurality of banks arranged in the first direction to form a second group of banks, the first group of banks and the second group of banks arranged in a second direction; a first local data line arranged in the second direction to cross a bank of the second plurality of banks and to transfer input/output data; a second local data line arranged in the second direction to transfer input/output data; a global data line disposed in the first direction that crosses the second direction; and a data exchanger disposed between the second plurality of banks and the global data line for configured to controlling data exchange between the first and second local data lines and the global data line.

Abstract: Disclosed is a semiconductor memory apparatus capable of improving precharge performance. The semiconductor memory apparatus includes a plurality of memory banks, data input/output lines commonly connected to the memory banks, and a plurality of precharge circuit units connected to the data input/output lines and aligned in an extension direction of the data input/output lines while being spaced apart from each other by a predetermined distance.

Abstract: A write driving circuit includes a plurality of driving units that write data corresponding to detection signals on memory banks, and at least one detecting unit that detects data input from the outside, and outputs the detection signals to two or more driving units among the plurality of driving units.

Abstract: A flip-flop circuit includes a first inverter for inverting a signal of a first node and transferring an inverted signal to a second node, and a second inverter for feeding back a signal of the second node and transferring a feedback signal to the first node. The second inverter includes: a first PMOS transistor and a first NMOS transistor, each gate of which receives the signal of the second node; a second PMOS transistor connected to the first PMOS transistor and having a gate receiving a first voltage, the second PMOS transistor being longer than the first PMOS transistor; and a second NMOS transistor connected to the first NMOS transistor and having a gate receiving a second voltage, the second NMOS transistor being longer than the first NMOS transistor.