Patents by Inventor Jeff CONNELL

Jeff CONNELL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11448512
    Abstract: Systems and methods for verifying mapping information are provided. In some aspects, a method includes receiving control data acquired in an area of interest, the control data comprising a plurality of control points, and receiving mapping data associated with the area of interest, the mapping data comprising a plurality of mapping points that correspond to the plurality control points. The method also includes applying a localization algorithm to the control data to generate a control track, and applying the localization algorithm to the mapping data to generate a mapping track. The method further includes comparing the control track and the mapping track to determine a difference.
    Type: Grant
    Filed: April 6, 2020
    Date of Patent: September 20, 2022
    Assignee: HERE Global B.V.
    Inventors: Jeff Connell, Anish Mittal, David Johnston Lawlor
  • Publication number: 20210310812
    Abstract: Systems and methods for verifying mapping information are provided. In some aspects, a method includes receiving control data acquired in an area of interest, the control data comprising a plurality of control points, and receiving mapping data associated with the area of interest, the mapping data comprising a plurality of mapping points that correspond to the plurality control points. The method also includes applying a localization algorithm to the control data to generate a control track, and applying the localization algorithm to the mapping data to generate a mapping track. The method further includes comparing the control track and the mapping track to determine a difference.
    Type: Application
    Filed: April 6, 2020
    Publication date: October 7, 2021
    Applicant: HERE Global B.V.
    Inventors: Jeff Connell, Anish Mittal, David Johnston Lawlor
  • Publication number: 20210272310
    Abstract: Systems and methods for identifying data suitable for mapping are provided. In some aspects, the method includes receiving one or more images acquired in an area of interest, and selecting at least two ground control points within a field of view of the one or more images. The method also includes determining perceived locations for the at least two ground control points using the one or more images, and computing pairwise distances between the perceived locations and predetermined locations of the at least two ground control points. The method further includes comparing corresponding pairwise distances to identify differences therebetween, and determining a suitability of the one or more images for mapping based on the comparison.
    Type: Application
    Filed: February 27, 2020
    Publication date: September 2, 2021
    Inventors: JEFF CONNELL, ANISH MITTAL, DAVID JOHNSTON LAWLOR
  • Patent number: 11107235
    Abstract: Systems and methods for identifying data suitable for mapping are provided. In some aspects, the method includes receiving one or more images acquired in an area of interest, and selecting at least two ground control points within a field of view of the one or more images. The method also includes determining perceived locations for the at least two ground control points using the one or more images, and computing pairwise distances between the perceived locations and predetermined locations of the at least two ground control points. The method further includes comparing corresponding pairwise distances to identify differences therebetween, and determining a suitability of the one or more images for mapping based on the comparison.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: August 31, 2021
    Assignee: HERE Global B.V.
    Inventors: Jeff Connell, Anish Mittal, David Johnston Lawlor
  • Patent number: 11024054
    Abstract: An approach is provided for determining the quality of camera pose data. The approach, for example, involves identifying camera pose data for a camera used to capture an image. The approach further involves processing the image to determine a pixel location of features visible in the image, wherein each feature has a known physical location (e.g., obtained using survey techniques or equivalent). The approach further involves determining a camera physical location of the camera based on the camera pose data. The approach further involves determining an physical location of the image plane based on the camera pose data and/or camera parameters (e.g., intrinsic camera parameters). The approach further involves projecting a ray from the camera physical location thorough the image plane physical location corresponding to the pixel location determined for each feature, and computing a minimum distance between the projected ray and the known physical location of each feature.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: June 1, 2021
    Assignee: HERE Global B.V.
    Inventors: David Johnston Lawlor, Anish Mittal, Niranjan Kotha, Jeff Connell
  • Patent number: 11003934
    Abstract: An approach is provided for automatically selecting the most appropriate sensor system for high-definition map feature accuracy and reliability specifications. The approach, for example, involves selecting at least one survey point that has a known physical location. The approach also involves initiating a plurality of passes to capture a plurality of images of the at least one survey point using a sensor system. For each pass, the approach further involves calculating an estimated location of the at least one survey point based on the plurality of images and calculating error data based on the estimated location and the known location. The approach also involves generating an error curve with respect to a number of the plurality of passes based on the error data for said each pass. The approach further involves providing an output indicating a target number of passes to meet an error specification based on the error curve.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: May 11, 2021
    Assignee: HERE Global B.V.
    Inventors: Jeff Connell, Anish Mittal
  • Publication number: 20210064902
    Abstract: An approach is provided for automatically selecting the most appropriate sensor system for high-definition map feature accuracy and reliability specifications. The approach, for example, involves selecting at least one survey point that has a known physical location. The approach also involves initiating a plurality of passes to capture a plurality of images of the at least one survey point using a sensor system. For each pass, the approach further involves calculating an estimated location of the at least one survey point based on the plurality of images and calculating error data based on the estimated location and the known location. The approach also involves generating an error curve with respect to a number of the plurality of passes based on the error data for said each pass. The approach further involves providing an output indicating a target number of passes to meet an error specification based on the error curve.
    Type: Application
    Filed: August 30, 2019
    Publication date: March 4, 2021
    Inventors: Jeff CONNELL, Anish MITTAL
  • Publication number: 20200364898
    Abstract: An approach is provided for determining the quality of camera pose data. The approach, for example, involves identifying camera pose data for a camera used to capture an image. The approach further involves processing the image to determine a pixel location of features visible in the image, wherein each feature has a known physical location (e.g., obtained using survey techniques or equivalent). The approach further involves determining a camera physical location of the camera based on the camera pose data. The approach further involves determining an physical location of the image plane based on the camera pose data and/or camera parameters (e.g., intrinsic camera parameters). The approach further involves projecting a ray from the camera physical location thorough the image plane physical location corresponding to the pixel location determined for each feature, and computing a minimum distance between the projected ray and the known physical location of each feature.
    Type: Application
    Filed: May 16, 2019
    Publication date: November 19, 2020
    Inventors: David Johnston LAWLOR, Anish MITTAL, Niranjan KOTHA, Jeff CONNELL