Patents by Inventor Jeff E. Blackwood

Jeff E. Blackwood has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wafer holder for backside viewing, frontside probing on automated wafer probe stations
    Patent number: 6747464
    Abstract: An integrated circuit test apparatus and a method for testing an integrated circuit are described. The integrated circuit test apparatus includes a holder adapted to receive a wafer, where a frontside of the wafer is accessible to be probe tested by electrically conducting probe needles during which a backside of the wafer is accessible to be scanned by an optical scanning mechanism. The scanning mechanism can optically detect photoemission-generated defects resulting from electrical stimuli applied to the integrated circuits via the probe needles. The holder is coupled to a three-dimensional translational mechanism that will allow for automated multi-die test probing.
    Type: Grant
    Filed: June 21, 2001
    Date of Patent: June 8, 2004
    Assignee: LSI Logic Corporation
    Inventor: Jeff E. Blackwood