Abstract: The present invention allows multiple IC devices to be placed on the same substrate within a single BGA package. The invention requires minimum distances to be kept between electrical connections of the IC devices to maintain the electrical isolation, so that the devices can be operated at different voltage differentials. Signals between the devices can be connected externally from the package to each other utilizing galvanic isolation techniques. The invention provides the flexibility of choice for the customers to use isolation or not between the devices and takes up less PC board space because only a single package is used on the board.

Abstract: The present invention allows multiple IC devices to be placed on the same substrate within a single BGA package. The invention requires minimum distances to be kept between electrical connections of the IC devices to maintain the electrical isolation, so that the devices can be operated at different voltage differentials. Signals between the devices can be connected externally from the package to each other utilizing galvanic isolation techniques. The invention provides the flexibility of choice for the customers to use isolation or not between the devices and takes up less PC board space because only a single package is used on the board.

Abstract: A modified lead frame is provided for use with electrical component test handlers. A conventional multiple-parallel-conductor lead frame is modified to include two broad, electrically conductive shields positioned on opposite sides of the lead frame. Each shield covers a major portion of one side of the lead frame. Such lead frames are designed for mounting in a predetermined orientation on a lead frame holder, with one side facing toward, and the other side facing away from, the major mass of the holder. The conductive shield positioned on the side facing away from the holder on the modified lead frame of the present invention is electrically coupled to one or more selected conductors on the lead frame. The one or more selected conductors include the power or ground conductor which supplies power to a test component during tests. The shield which faces toward the holder is electrically isolated from all the conductors on the lead frame by an intermediate insulating layer.