Patents by Inventor Jeff Gust

Jeff Gust has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240369667
    Abstract: A method and apparatus for calibrating an impedance measurement device (100a, 100b, 100c) are provided. The impedance measurement device outputs (502) a first AC signal to a phase-locked current generator (124). The phase-locked current generator generates (504) a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs (506) an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated (508) based on the measured impedance value and the known impedance value of the presented impedance.
    Type: Application
    Filed: August 16, 2022
    Publication date: November 7, 2024
    Inventors: Liangzhu Chen, Songnan Fan, Lianqun Wu, Milen Todorakev, Jeff Gust
  • Patent number: 11525881
    Abstract: A method and apparatus for calibrating an impedance measurement device are provided. The impedance measurement device outputs a first AC signal to a phase-locked current generator. The phase-locked current generator generates a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated based on the measured impedance value and the known impedance value of the presented impedance.
    Type: Grant
    Filed: August 17, 2021
    Date of Patent: December 13, 2022
    Assignee: Fluke Corporation
    Inventors: Liangzhu Chen, Songnan Fan, Lianqun Wu, Milen Todorakev, Jeff Gust