Abstract: Battery testing systems and methods are disclosed. One system includes one or more test platforms and a processing system. Each test platform performs ultrasonic scans of batteries. During the scans, each test platform can place pressure upon and measure temperature and open circuit voltages of each battery, transmit ultrasound signals into each battery and generate transmitted signal data in response, detect ultrasound signals reflected by or transmitted through each battery in response to the transmitted ultrasound signals and generate received signal data in response. The processing system can quantify aspects of the signal data and present the aspects to one or more battery models, which compute and assign a state of charge (SOC) and a state of health (SOH) to each battery in response. For example, the processing system can be in a service provider network that receives and analyzes signal data sent from test platforms at different customer facilities.

Abstract: Battery testing systems and methods are disclosed. One system includes one or more test platforms and a processing system. Each test platform performs ultrasonic scans of batteries. During the scans, each test platform can place pressure upon and measure temperature and open circuit voltages of each battery, transmit ultrasound signals into each battery and generate transmitted signal data in response, detect ultrasound signals reflected by or transmitted through each battery in response to the transmitted ultrasound signals and generate received signal data in response. The processing system can quantify aspects of the signal data and present the aspects to one or more battery models, which compute and assign a state of charge (SOC) and a state of health (SOH) to each battery in response. For example, the processing system can be in a service provider network that receives and analyzes signal data sent from test platforms at different customer facilities.

Abstract: Battery testing systems and methods are disclosed. One system includes one or more test platforms and a processing system. Each test platform performs ultrasonic scans of batteries. During the scans, each test platform can place pressure upon and measure temperature and open circuit voltages of each battery, transmit ultrasound signals into each battery and generate transmitted signal data in response, detect ultrasound signals reflected by or transmitted through each battery in response to the transmitted ultrasound signals and generate received signal data in response. The processing system can quantify aspects of the signal data and present the aspects to one or more battery models, which compute and assign a state of charge (SOC) and a state of health (SOH) to each battery in response. For example, the processing system can be in a service provider network that receives and analyzes signal data sent from test platforms at different customer facilities.

Abstract: One embodiment of the present invention sets forth a technique for generating design variations. The technique involves identifying a first design variable and a second design variable associated with a first design. The technique further involves generating a first plurality of design variations based on the first design. Each design variation is generated by varying at least one of the first design variable and the second design variable. Finally, the technique involves causing the first plurality of design variations to be displayed to a user.

Abstract: An example apparatus includes a first axle extending from a left side support to a right side support, the first axle configured to axially rotate; a second axle extending from the left side support to the right side support and being substantially parallel to the first axle, the second axle configured to axially rotate, the second axle and the first axle being spaced apart. Each of the first axle and second axle include two or more lower support wheel assemblies and two or more higher support wheel assemblies alternatingly positioned along each axle. The higher support wheel assemblies have a larger diameter than the lower support wheel assemblies, and each of the lower support wheel assemblies and the higher support wheel assemblies are configured to axially rotate with a corresponding axle.

Abstract: An example apparatus includes a first axle extending from a left side support to a right side support, the first axle configured to axially rotate; a second axle extending from the left side support to the right side support and being substantially parallel to the first axle, the second axle configured to axially rotate, the second axle and the first axle being spaced apart. Each of the first axle and second axle include two or more lower support wheel assemblies and two or more higher support wheel assemblies alternatingly positioned along each axle. The higher support wheel assemblies have a larger diameter than the lower support wheel assemblies, and each of the lower support wheel assemblies and the higher support wheel assemblies are configured to axially rotate with a corresponding axle.

Abstract: One embodiment of the present invention sets forth a technique for generating design variations. The technique involves identifying a first design variable and a second design variable associated with a first design. The technique further involves generating a first plurality of design variations based on the first design. Each design variation is generated by varying at least one of the first design variable and the second design variable. Finally, the technique involves causing the first plurality of design variations to be displayed to a user.

Abstract: One embodiment of the invention sets forth a graphics application configured to generate previews of a graphics object when a configurable parameter is modified. A computation engine computes the result of the modified parameter value and determines a set of additional parameter values based on configurable meta-data. The computation engine then computes results of each additional parameter value. Each computed result specifies a different change in the characteristic of the graphics object. The computation engine transmits the computed results to a preview generator, also included in the graphics application. For each computed result, the preview generator generates a preview of the graphics object that incorporates the change in the characteristic of the graphics object. The previews are transmitted to a preview pane for display. The user may then select one of the previews, and the parameter value of the configurable parameter is modified based on the selected preview.

Abstract: One embodiment of the invention sets forth a graphics application configured to generate previews of a graphics object when a configurable parameter is modified. A computation engine computes the result of the modified parameter value and determines a set of additional parameter values based on configurable meta-data. The computation engine then computes results of each additional parameter value. Each computed result specifies a different change in the characteristic of the graphics object. The computation engine transmits the computed results to a preview generator, also included in the graphics application. For each computed result, the preview generator generates a preview of the graphics object that incorporates the change in the characteristic of the graphics object. The previews are transmitted to a preview pane for display. The user may then select one of the previews, and the parameter value of the configurable parameter is modified based on the selected preview.

Abstract: An apparatus for heat treatment of a wafer is disclosed. The apparatus includes a heating chamber having a heat source. A cooling chamber is positioned adjacent to the heating chamber and includes a cooling source. A wafer holder is configured to move between the cooling chamber and the heating chamber through a passageway and one or more shutters defines the size of the passageway. The one or more shutters are movable between an open position where the wafer holder can pass through the passageway and an obstructing position which defines a passageway which is smaller than the passageway defined when the shutter is in the open position.

Abstract: An apparatus for heat treatment of a wafer is disclosed. The apparatus includes a heating chamber having a heat source. A cooling chamber is positioned adjacent to the heating chamber and includes a cooling source. A wafer holder is configured to move between the cooling chamber and the heating chamber through a passageway and one or more shutters defines the size of the passageway. The one or more shutters are movable between an open position where the wafer holder can pass through the passageway and an obstructing position which defines a passageway which is smaller than the passageway defined when the shutter is in the open position.

Abstract: An apparatus for heat treatment of a wafer is disclosed. The apparatus includes a heating chamber having a heat source. A cooling chamber is positioned adjacent to the heating chamber and includes a cooling source. A wafer holder is configured to move between the cooling chamber and the heating chamber through a passageway and one or more shutters defines the size of the passageway. The one or more shutters are movable between an open position where the wafer holder can pass through the passageway and an obstructing position which defines a passageway which is smaller than the passageway defined when the shutter is in the open position.