Patents by Inventor Jeff Milkey

Jeff Milkey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11480944
    Abstract: Exemplary embodiments relate to methods, mediums, and systems for associating information, including critical-to-quality (CTQ) information such as minimum or maximum part dimensions, with parts in a three-dimensional model of a product. The information may be identified by performing a failure mode effect analysis (FMEA) against the model. The information is stored with the model data (e.g., in the form of an annotation applied to a model feature corresponding to the part in question). The model data may be consulted by product lifecycle management (PLM) applications during various phases of the product's lifecycle. Among other possibilities, the information may be used to automatically generate regulatory compliance documentation, to ensure product quality standards are met during a manufacturing process, or to perform postproduction quality monitoring of the product.
    Type: Grant
    Filed: February 18, 2020
    Date of Patent: October 25, 2022
    Inventors: David Wolf, Michael Prudhomme, Swapan Jha, Jeff Milkey
  • Publication number: 20200183358
    Abstract: Exemplary embodiments relate to methods, mediums, and systems for associating information, including critical-to-quality (CTQ) information such as minimum or maximum part dimensions, with parts in a three-dimensional model of a product. The information may be identified by performing a failure mode effect analysis (FMEA) against the model. The information is stored with the model data (e.g., in the form of an annotation applied to a model feature corresponding to the part in question). The model data may be consulted by product lifecycle management (PLM) applications during various phases of the product's lifecycle. Among other possibilities, the information may be used to automatically generate regulatory compliance documentation, to ensure product quality standards are met during a manufacturing process, or to perform postproduction quality monitoring of the product.
    Type: Application
    Filed: February 18, 2020
    Publication date: June 11, 2020
    Inventors: David Wolf, Michael Prudhomme, Swapan Jha, Jeff Milkey
  • Patent number: 10591898
    Abstract: Exemplary embodiments relate to methods, mediums, and systems for associating information, including critical-to-quality (CTQ) information such as minimum or maximum part dimensions, with parts in a three-dimensional model of a product. The information may be identified by performing a failure mode effect analysis (FMEA) against the model. The information is stored with the model data (e.g., in the form of an annotation applied to a model feature corresponding to the part in question). The model data may be consulted by product lifecycle management (PLM) applications during various phases of the product's lifecycle. Among other possibilities, the information may be used to automatically generate regulatory compliance documentation, to ensure product quality standards are met during a manufacturing process, or to perform postproduction quality monitoring of the product.
    Type: Grant
    Filed: June 2, 2017
    Date of Patent: March 17, 2020
    Assignee: PTC, Inc
    Inventors: David Wolf, Michael Prudhomme, Swapan Jha, Jeff Milkey
  • Publication number: 20170351244
    Abstract: Exemplary embodiments relate to methods, mediums, and systems for associating information, including critical-to-quality (CTQ) information such as minimum or maximum part dimensions, with parts in a three-dimensional model of a product. The information may be identified by performing a failure mode effect analysis (FMEA) against the model. The information is stored with the model data (e.g., in the form of an annotation applied to a model feature corresponding to the part in question). The model data may be consulted by product lifecycle management (PLM) applications during various phases of the product's lifecycle. Among other possibilities, the information may be used to automatically generate regulatory compliance documentation, to ensure product quality standards are met during a manufacturing process, or to perform postproduction quality monitoring of the product.
    Type: Application
    Filed: June 2, 2017
    Publication date: December 7, 2017
    Inventors: David Wolf, Michael Prudhomme, Swapan Jha, Jeff Milkey