Abstract: Pre-connected analyte sensors are provided. A pre-connected analyte sensor includes a sensor carrier attached to an analyte sensor. The sensor carrier includes a substrate configured for mechanical coupling of the sensor to testing, calibration, or wearable equipment. The sensor carrier also includes conductive contacts for electrically coupling sensor electrodes to the testing, calibration, or wearable equipment.

Abstract: The present disclosure relates generally to certain 6-azabenzimidazole compounds, pharmaceutical compositions comprising said compounds, and methods of making and using said compounds and pharmaceutical compositions. The compounds and compositions disclosed herein may be used for the treatment or prevention of diseases, disorders, or infections modifiable by hematopoietic progenitor kinase 1 (HPK1) inhibitors, such as HBV, HIV, cancer, and/or a hyper-proliferative disease.

Abstract: A system for accessing computing elements of a cloud computing infrastructure includes a dynamic host interface associated with an identity-based access management system. The dynamic host interface is configured to receive host catalogs from components of the cloud computing infrastructure, each host catalog including one or more host sets, each of the one or more host sets including references to one or more hosts, where each of the one or more hosts represents an addressable computing element. The system further includes a plugin-based hosts model in a memory, and being configured to receive, from the dynamic host interface, the host catalogs for identity-based access to the one or more host sets by a user of a client computer to address the addressable computing element represented by the host.

Abstract: A system and method for accessing and using one or more networked services of a cloud computing infrastructure by a user of a client computer includes an identity-based access management system that is configured to receive a request for a session via an API to use a specific service of the one or more networked services. A credential store includes a credential library that receives and stores credentials for authorizing and enabling the session with the specific service of the one or more networked services. A target service is configured to authorize and enable the session based on the received credentials. A secrets management system is configured to authenticate the user and the client computer to access and use the specific service authorized by the target service, and to generate a lease to a credential that is transmitted to the client computer to authorize the session with the specific service.

Abstract: Special performance standby nodes for data storage in a cloud computing security system are disclosed. Performance standby nodes are standby nodes that are configured to service requests that do not modify the underlying data store. These pseudo read-replica nodes are further configured to forward any request that results in a storage write onto an active node, while being able to service read-only requests locally.

Abstract: A wristband slingshot that can be used to launch projectiles. The invention preferably has two holes on either end designed to fit a user's fingers. The finger holes are used to stretch the device between two of the user's fingers so a projectile can be launched from the center, which has an increased area—acting as a pouch. The center section with increased area, or pouch, preferably contains grooves and a hole in the center in order to grip and center a projectile. While the main function of the current invention is to act as a projectile launcher, it is designed to have multiple functions. The device preferably comprises a clasping mechanism that is integrated into finger holes already contained in the device.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: Tools are provided to facilitate the removal and installation of first and second check valves from backflow prevention devices. A tool for a first check valve includes a frame having a straight central portion with a plurality of leg portions extending from the central portion. The leg portions can be configured such that, when the tool is brought into engagement with a first check valve, each leg potion can be at least partially received in a respective recess on the base of a first check valve. A tool for a second check valve can include a plurality of arms. The arms can be configured so that, when the tool is brought into engagement with a second check valve, each arm can engage a respective pin provided on the base of a second check valve. The tools can be adapted to be engaged by another tool, such as a socket wrench.

Abstract: A projectile launcher for launching soft projectiles. The projectile launcher features a pump assembly having a cylinder and piston. The piston includes a pump grip so that a pressure charge is generated when the user moves the piston. The pressure charge is released into a chamber which contains a soft projectile. The chamber includes a radius bend joining a projectile receiving orifice to a projectile discharging orifice. The pressure charge is introduced proximate the apex of the radius bend.

Abstract: Some embodiments of the invention provide a computerized method for creating and editing a multimedia item. The method provides a menu theme for a multimedia item. The menu theme includes a display section for displaying a multimedia item, an adjustable text section for displaying several selectable text options, and a special effect built into the menu theme for applying to the multimedia item. The method presents the multimedia item on display after applying the special effect to the multimedia item.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: Some embodiments of the invention provide a computerized method for creating and editing a multimedia item. The method provides a menu theme for a multimedia item. The menu theme includes a display section for displaying a multimedia item, an adjustable text section for displaying several selectable text options, and a special effect built into the menu theme for applying to the multimedia item. The method presents the multimedia item on display after applying the special effect to the multimedia item.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

Abstract: Some embodiments of the invention provide a computerized method for creating and editing a multimedia item. The method provides a menu theme for a multimedia item. The menu theme includes a display section for displaying a multimedia item, an adjustable text section for displaying several selectable text options, and a special effect built into the menu theme for applying to the multimedia item. The method presents the multimedia item on display after applying the special effect to the multimedia item.

Abstract: This invention relates to methods and systems for forming composite extrudates including at least a base polymer, a plurality of fibers dispersed in the base polymer, and one or more colorants forming a visible, multi-color pattern, e.g., mimicking the appearance of natural wood.

Abstract: In a software development environment, a system and method for associating an assert with a unique identifier (“assert tag”), and using the unique identifier to store information associated with the assert in a database. Based on the unique identifier, information associated with the assert can be stored in a database or repository that contains assert information. This information can be updated, as well as displayed to the developer or tester. Information for the bugs associated with the assert can be retrieved from a database containing bug information and displayed to the developer or tester. Once the developer or tester has been presented with the information concerning the bugs associated with the assert, or other information associated with-the assert, the developer or tester can choose to enter or log-in a new bug into the database containing bug information.

Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.