Patents by Inventor Jeff Walajtys

Jeff Walajtys has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods relating to AFIS recognition, extraction, and 3-D analysis strategies
    Patent number: 7356171
    Abstract: Systems, methods, etc., that that assist a print examiner to thoroughly search and compare a print or substantial portion thereof against a known print database contained within an AFIS system. In certain embodiments, the prints can be definitively matched to a corresponding same print in the database. A result of a more thorough search and comparison can be a higher hit score and accuracy rate. In certain embodiments, the database comprises a candidate list of previously obtained prints to assist in the identification.
    Type: Grant
    Filed: September 26, 2006
    Date of Patent: April 8, 2008
    Assignee: LumenIQ, Inc.
    Inventors: Kasey Werthiem, Jeff Walajtys
  • Systems and methods relating to AFIS recognition, extraction, and 3-D analysis strategies
    Publication number: 20070165914
    Abstract: Systems, methods, etc., that that assist a print examiner to thoroughly search and compare a print or substantial portion thereof against a known print database contained within an AFIS system. In certain embodiments, the prints can be definitively matched to a corresponding same print in the database. A result of a more thorough search and comparison can be a higher hit score and accuracy rate. In certain embodiments, the database comprises a candidate list of previously obtained prints to assist in the identification.
    Type: Application
    Filed: September 26, 2006
    Publication date: July 19, 2007
    Inventors: Kasey Werthiem, Jeff Walajtys
  • Systems and methods relating to AFIS recognition, extraction, and 3-D analysis strategies
    Patent number: 7116806
    Abstract: Systems, methods, etc., that assist a print examiner to thoroughly search and compare a print or substantial portion thereof against a known print database contained within an AFIS system. In certain embodiments, the prints can be definitively matched to a corresponding same print in the database. A result of a more thorough search and comparison can be a higher hit score and accuracy rate. In certain embodiments, the database comprises a candidate list of previously obtained prints to assist in the identification.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: October 3, 2006
    Assignee: LumenIQ, Inc.
    Inventors: Kasey Werthiem, Jeff Walajtys
  • Systems and methods relating to AFIS recognition, extraction, and 3-D analysis strategies
    Publication number: 20050123175
    Abstract: Systems, methods, etc., that that assist a print examiner to thoroughly search and compare a print or substantial portion thereof against a known print database contained within an AFIS system. In certain embodiments, the prints can be definitively matched to a corresponding same print in the database. A result of a more thorough search and comparison can be a higher hit score and accuracy rate. In certain embodiments, the database comprises a candidate list of previously obtained prints to assist in the identification.
    Type: Application
    Filed: October 12, 2004
    Publication date: June 9, 2005
    Inventors: Kasey Werthiem, Jeff Walajtys