Patents by Inventor Jeffery Allan Shepler

Jeffery Allan Shepler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges
    Patent number: 10060963
    Abstract: Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges are disclosed herein. The methods are configured to test a plurality of devices under test (DUTs) present on a substrate. The probe systems are programmed to perform the methods. The storage media include computer-readable instructions that direct a probe system to perform the methods.
    Type: Grant
    Filed: March 28, 2017
    Date of Patent: August 28, 2018
    Assignee: FormFactor Beaverton, Inc.
    Inventors: Timothy Allen McMullen, Jeffery Allan Shepler, Clint Vander Giessen
  • PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES
    Publication number: 20170285083
    Abstract: Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges are disclosed herein. The methods are configured to test a plurality of devices under test (DUTs) present on a substrate. The probe systems are programmed to perform the methods. The storage media include computer-readable instructions that direct a probe system to perform the methods.
    Type: Application
    Filed: March 28, 2017
    Publication date: October 5, 2017
    Inventors: Timothy Allen McMullen, Jeffery Allan Shepler, Clint Vander Giessen