Patents by Inventor Jeffery C. Gannon

Jeffery C. Gannon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Accelerometer transducer used for seismic recording
    Patent number: 6883638
    Abstract: Method for operating and testing a sensor assembly (210). The sensor assembly (210) preferably includes accelerometers with axes of sensitivity orthogonal to each other. The method preferably includes determining sensor tilt angle, determining the position of the sensor, and synchronizing the operation of the sensor.
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: April 26, 2005
    Assignee: Input/Output, Inc.
    Inventors: Peter Maxwell, Lawrence P. Behn, Eugene D. Bednar, Jeffery C. Gannon, Michael Arthur Corrigan, Glen Ragan, Dale J. Lambert, Henry Thomas Polk, Steven L. Roche, Wilfred Roy Bertrand, David Wilson, Byron Lee Cain, Michael George McMahon, John C. Downey Jr., Keith Elder
  • Method and apparatus for generation of test bitstreams and testing of close loop transducers
    Patent number: 6101864
    Abstract: A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.
    Type: Grant
    Filed: December 17, 1997
    Date of Patent: August 15, 2000
    Assignee: I/O Sensors, Inc.
    Inventors: Michael L. Abrams, Ben W. Jones, Franklin W. Mayo, Scott T. Dupuie, Jeffery C. Gannon, Richard A. Johnson
  • Method and apparatus for generation of test bitstreams and testing of closed loop transducers
    Patent number: 6023960
    Abstract: A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: February 15, 2000
    Assignee: I/O Sensors, Inc.
    Inventors: Michael L. Abrams, Ben W. Jones, Franklin W. Mayo, Scott T. Dupuie, Jeffery C. Gannon, Richard A. Johnson