Patents by Inventor Jeffery P. Wright

Jeffery P. Wright has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor memory implementing internally generated commands
    Patent number: 6526533
    Abstract: Systems, methods and apparatus for accessing integrated circuits, such as semiconductor memories and particularly in testing, by reducing the number of clock cycles required to apply sequences of command and address signals to a m-dimensional structure of such integrated circuit, such as a memory array. The system, methods and apparatus comprise structure and steps by which commands are issued responsive to external controls signals and commands are generated independent of such signals, such commands being communicated internal to the integrated circuit via separate data paths.
    Type: Grant
    Filed: September 6, 2000
    Date of Patent: February 25, 2003
    Assignee: Micron Technology, Inc.
    Inventors: Timothy B. Cowles, Jeffery P. Wright
  • Integrated circuit implementing internally generated commands
    Patent number: 6253340
    Abstract: Systems, methods and apparatus for accessing integrated circuits, such as semiconductor memories and particularly in testing, by reducing the number of clock cycles required to apply sequences of command and address signals to a m-dimensional structure of such integrated circuit, such as a memory array. The system, methods and apparatus comprise structure and steps by which commands are issued responsive to external controls signals and commands are generated independent of such signals, such commands being communicated internal to the integrated circuit via separate data paths.
    Type: Grant
    Filed: June 8, 1998
    Date of Patent: June 26, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Timothy B. Cowles, Jeffery P. Wright
  • Testing parameters of an electronic device
    Patent number: 5995426
    Abstract: A method for testing an electronic device includes causing the device to perform an operation. Using circuitry of the device, a duration of time is asynchronously measured in association with the step of causing. The operation is controlled in response to the expiration of the duration.
    Type: Grant
    Filed: November 4, 1997
    Date of Patent: November 30, 1999
    Assignee: Micron Technology, Inc.
    Inventors: Timothy B. Cowles, Jeffery P. Wright