Abstract: A contact pin that comprises an elongated body having a central axis and first and second ends, a plurality of flanges near the second end of the elongated body for connecting a wire to the body, a plurality of tabs on the body, the tabs being biased away from the central axis of the body and a plurality of protrusions displaced along the body from the tabs. The plurality of flanges may comprise a first pair of flanges for contacting a conducting portion of a wire and a second pair of flanges for connecting the contact pin to an insulator on the wire. The plurality of protrusions may comprise gimbals, which may be circular or any other shape. The plurality of protrusions may be located on the body of the contact pin near the second, or crimp end of the contact pin. Alternatively or additionally, at least one of the plurality of protrusions may be located on the body of the contact pin near the first, or contact end of the contact pin.

Abstract: A modular interface test adapter having a base, a cover and a bushing or card support that permits easy access to modules, pins and patchcords in the test adapter for activities such as troubleshooting and repairs. The cover is removable and has a structure, such as a tongue and groove, for mating with a corresponding structure in a base. The bushing or card support is removable from the cover.

Abstract: A modular interface test adapter having a base, a cover, and a bushing or card support that permits easy access to modules, pins, and patchcords in the test adapter for activities such as troubleshooting and repairs.