Abstract: A reflectometer configured to test a sample. The reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. The reflectometer focuses the light beam to a reduced spot size on the sample. The reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.

Abstract: A specular variable angle absolute reflectometer includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes an elliptical roof mirror disposed in the light path after the sample having an ellipsoidal reflector surface configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the elliptical roof mirror. The mechanism is configured to rotate the elliptical roof mirror about an axis of the sample. The device also includes a detector in the light path after the elliptical roof mirror such that the detector receives light that has been reflected from the elliptical roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A specular variable angle absolute reflectometer includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes an elliptical roof mirror disposed in the light path after the sample having an ellipsoidal reflector surface configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the elliptical roof mirror. The mechanism is configured to rotate the elliptical roof mirror about an axis of the sample. The device also includes a detector in the light path after the elliptical roof mirror such that the detector receives light that has been reflected from the elliptical roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A specular variable angle absolute reflectometer. The device includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes a roof mirror disposed in the light path after the sample. The roof mirror is configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the roof mirror. The mechanism is configured to rotate the roof mirror about an axis of the sample. The device also includes a detector in the light path after the roof mirror such that the detector receives light that has been reflected from the roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: A specular variable angle absolute reflectometer. The device includes a light source and a mirror system in a light path of the light source. The mirror system is configured to reflect a light beam from the light source towards a sample that is optically reflective. The device also includes a roof mirror disposed in the light path after the sample. The roof mirror is configured to reflect the light beam back towards the sample. The device also includes a mechanism connected to the roof mirror. The mechanism is configured to rotate the roof mirror about an axis of the sample. The device also includes a detector in the light path after the roof mirror such that the detector receives light that has been reflected from the roof mirror, thence back to the sample, thence back to the mirror system, and thence to the detector.

Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.

Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.