Patents by Inventor Jeffery Wayne Eberhard

Jeffery Wayne Eberhard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for X-ray imaging
    Patent number: 8885910
    Abstract: An energy-sensitive system includes one or more processors configured to determine spectral attenuation curves for a first basis material and a second basis material, respectively. The one or more processors are configured to substitute a k-edge feature in the determined spectral attenuation curves with an approximation of the determined spectral attenuation curves lacking the k-edge feature. The one or more processors are also configured to construct a material decomposition model based on one of the determined or approximated first and second spectral attenuation curves. The one or more processors are additionally configured to decompose X-ray projection data into basis material projection data comprising first and second line integrals based, at least in part, on the model.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: November 11, 2014
    Assignee: General Electric Company
    Inventors: Peter Michael Edic, Colin Richard Wilson, Jeffery Wayne Eberhard, Dan Xu
  • SYSTEMS AND METHODS FOR X-RAY IMAGING
    Publication number: 20140185901
    Abstract: An energy-sensitive system includes one or more processors configured to determine spectral attenuation curves for a first basis material and a second basis material, respectively. The one or more processors are configured to substitute a k-edge feature in the determined spectral attenuation curves with an approximation of the determined spectral attenuation curves lacking the k-edge feature. The one or more processors are also configured to construct a material decomposition model based on one of the determined or approximated first and second spectral attenuation curves. The one or more processors are additionally configured to decompose X-ray projection data into basis material projection data comprising first and second line integrals based, at least in part, on the model.
    Type: Application
    Filed: December 28, 2012
    Publication date: July 3, 2014
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Peter Michael Edic, Colin Richard Wilson, Jeffery Wayne Eberhard, Dan Xu