Patents by Inventor Jeffrey A. Hawkins

Jeffrey A. Hawkins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6288557
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: September 11, 2001
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Patent number: 6002263
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: June 6, 1997
    Date of Patent: December 14, 1999
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Patent number: 4605970
    Abstract: A calibration strip (80) is described for use in calibrating an optical document digitizer. The strip (80) includes an optically detectible pattern including plural discrete blocks (82) with orthogonal first and second edges (84, 86). Edges (84) are parallel to the drum axis when strip (80) is mounted to the drum (10). As the drum (10) rotates, these first edges (84) are detected and provide a reference for a Y-coordinate axis. With the drum (10) stopped, the second edges (86) are detected by a scanning array (53), as it is stepped by a motor (60) along an X-coordinate axis. The microstep location of each of the detected edges (86) is stored. During document scanning, the array (53) moves along the X-axis to the known microstep locations. The strip (80) has shaft indexing and optics magnification patterns (210, 212).
    Type: Grant
    Filed: October 1, 1984
    Date of Patent: August 12, 1986
    Assignee: Tektronix, Inc.
    Inventor: Jeffrey A. Hawkins
  • Patent number: D320110
    Type: Grant
    Filed: December 6, 1988
    Date of Patent: September 24, 1991
    Inventor: Jeffrey Hawkins