Patents by Inventor Jeffrey A. Koch

Jeffrey A. Koch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10018577
    Abstract: A method and apparatus for imaging the distribution of bulk motional velocities in plasmas such as inertial confinement fusion (ICF) implosions. This method and apparatus use multiple narrow-band x-ray crystal imaging systems, one or more of which have a bandpass tuned to lie within the Doppler-broadened emission line profile of a suitable plasma emission line. Crystals tuned on the one end of the profile will preferentially reflect x-rays from plasma ions moving towards the crystals, while crystals tuned to another end of the profile will preferentially reflect x-rays from plasma ions moving away from the crystals.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: July 10, 2018
    Assignee: Mission Support and Tests Services, LLC
    Inventor: Jeffrey A. Koch
  • Patent number: 9945795
    Abstract: A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.
    Type: Grant
    Filed: March 18, 2016
    Date of Patent: April 17, 2018
    Assignee: National Security Technologies, Inc.
    Inventors: Jeffrey A. Koch, Michael J. Haugh
  • Publication number: 20170269010
    Abstract: A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.
    Type: Application
    Filed: March 18, 2016
    Publication date: September 21, 2017
    Inventors: Jeffrey A. Koch, Michael J. Haugh
  • Publication number: 20160290939
    Abstract: A method and apparatus for imaging the distribution of bulk motional velocities in plasmas such as inertial confinement fusion (ICF) implosions. This method and apparatus use multiple narrow-band x-ray crystal imaging systems, one or more of which have a bandpass tuned to lie within the Doppler-broadened emission line profile of a suitable plasma emission line. Crystals tuned on the one end of the profile will preferentially reflect x-rays from plasma ions moving towards the crystals, while crystals tuned to another end of the profile will preferentially reflect x-rays from plasma ions moving away from the crystals.
    Type: Application
    Filed: April 4, 2016
    Publication date: October 6, 2016
    Inventor: Jeffrey A. Koch
  • Patent number: 8919286
    Abstract: A system and method of feeding rolled bales of hay to livestock while simultaneously storing the hay off of the ground. The hay is presented in such a way that the livestock can graze on the hay bales at will, much as they would graze in a grass field. The system of storing and offering the hay bales is modular, and may be added to or subtracted from depending upon the size of the herd of livestock. Additionally, the invention is designed to be placed along an existing fence-line for simple access to the feeding system. This allows the system to act as a simple pass-through for hay bales for feeding purposes, as opposed to requiring that bales be physically picked up and placed on a feeder for each individual feeding. A trough for water or other types of feed may also be built directly into the system.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: December 30, 2014
    Assignee: Progressive Products, Inc.
    Inventor: Jeffrey A. Koch
  • Publication number: 20140020632
    Abstract: A system and method of feeding rolled bales of hay to livestock while simultaneously storing the hay off of the ground. The hay is presented in such a way that the livestock can graze on the hay bales at will, much as they would graze in a grass field. The system of storing and offering the hay bales is modular, and may be added to or subtracted from depending upon the size of the herd of livestock. Additionally, the invention is designed to be placed along an existing fence-line for simple access to the feeding system. This allows the system to act as a simple pass-through for hay bales for feeding purposes, as opposed to requiring that bales be physically picked up and placed on a feeder for each individual feeding. A trough for water or other types of feed may also be built directly into the system.
    Type: Application
    Filed: July 19, 2012
    Publication date: January 23, 2014
    Inventor: Jeffrey A. Koch
  • Patent number: 6590954
    Abstract: An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1× magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.
    Type: Grant
    Filed: June 20, 2002
    Date of Patent: July 8, 2003
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Jeffrey A. Koch