Patents by Inventor Jeffrey C. Vian

Jeffrey C. Vian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7871241
    Abstract: A self-monitoring adjustment system is provided for evaluating and effecting adjustment of the leakage restricting mechanism between the rotating and non-rotating elements of a rotodynamic pump to restrict leakage and to establish desired gap dimensions between the rotating and non-rotating elements of the pump. The adjustment system is structured to be self-monitoring for determination of when an adjustment of the leakage restricting mechanism is warranted by the conditions of the pump, and is structured with adjusting mechanisms that are self-adjusting responsive to the monitored conditions of the pump, though manual adjustment is also enabled.
    Type: Grant
    Filed: January 14, 2009
    Date of Patent: January 18, 2011
    Assignee: Weir Slurry Group, Inc.
    Inventors: Ronald J. Bourgeois, Randy J. Kosmicki, Jeffrey C. Vian, Tyler M. Erlandson, Michael L. Viken
  • Publication number: 20090180866
    Abstract: A self-monitoring adjustment system is provided for evaluating and effecting adjustment of the leakage restricting mechanism between the rotating and non-rotating elements of a rotodynamic pump to restrict leakage and to establish desired gap dimensions between the rotating and non-rotating elements of the pump. The adjustment system is structured to be self-monitoring for determination of when an adjustment of the leakage restricting mechanism is warranted by the conditions of the pump, and is structured with adjusting mechanisms that are self-adjusting responsive to the monitored conditions of the pump, though manual adjustment is also enabled.
    Type: Application
    Filed: January 14, 2009
    Publication date: July 16, 2009
    Applicant: WEIR SLURRY GROUP, INC.
    Inventors: Ronald J. Bourgeois, Randy J. Kosmicki, Jeffrey C. Vian, Tyler M. Erlandson, Michael L. Viken