Patents by Inventor Jeffrey D. Concordia

Jeffrey D. Concordia has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7522401
    Abstract: An apparatus, system, and method is provided including a plurality of test pins, a static dissipative layer having a plurality of openings, and a plurality of support features coupled to the static dissipative layer to movably support the static dissipative layer at a first and a second relative position. The support features enable the static dissipative layer to make initial contact with terminals of a component to be tested to discharge static, if any, built up at the terminals of the component while the static dissipative layer is supported at the first relative position. The support features also enable the static dissipative layer to expose the test pins through the openings to make contact with the terminals of the component after the static dissipative layer had made initial contact with the terminals of the component at the first relative position.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: April 21, 2009
    Assignee: Intel Corporation
    Inventors: Warly A. Dela Cruz, Charlene T. Hintay, Jeffrey D. Concordia
  • Publication number: 20070274018
    Abstract: An apparatus, system, and method is provided including a plurality of test pins, a static dissipative layer having a plurality of openings, and a plurality of support features coupled to the static dissipative layer to movably support the static dissipative layer at a first and a second relative position. The support features enable the static dissipative layer to make initial contact with terminals of a component to be tested to discharge static, if any, built up at the terminals of the component while the static dissipative layer is supported at the first relative position. The support features also enable the static dissipative layer to expose the test pins through the openings to make contact with the terminals of the component after the static dissipative layer had made initial contact with the terminals of the component at the first relative position.
    Type: Application
    Filed: May 26, 2006
    Publication date: November 29, 2007
    Inventors: Warly A. Dela Cruz, Charlene T. Hintay, Jeffrey D. Concordia