Patents by Inventor Jeffrey D. West

Jeffrey D. West has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing using clocked test access port controller for level sensitive scan designs
    Patent number: 6173428
    Abstract: A test access port controller for use in a level sensitive scan design having test design logic including at least one serial scan test path. The test access port controller includes test access port controller logic operable in a system test mode for controlling the serial shifting of input test data into the at least one serial scan test path and for controlling serial shifting of resulting output test data out of the at least one serial scan test path after performance of system mode test under control of a test clock. The test access port controller further includes clock logic for providing the test clock to the test access port controller logic and the test design logic in system test mode.
    Type: Grant
    Filed: November 16, 1994
    Date of Patent: January 9, 2001
    Assignee: Cray Research, Inc.
    Inventor: Jeffrey D. West