Patents by Inventor Jeffrey Danes

Jeffrey Danes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for determining recycled thermoplastic content
    Patent number: 8063374
    Abstract: A system and method of identifying a reference standard library for thermoplastic content includes preparing a plurality of samples of each one of a plurality of known ratios of virgin thermoplastic/recycled thermoplastic, analyzing each of the plurality of samples of each one of the plurality of known ratios of virgin thermoplastic/recycled thermoplastic with at least one of a group of analyses consisting of: a differential scanning calorimetry analysis; a physical thickness analysis; an ultraviolet-visible spectroscopy analysis; an attenuated total reflectance Fourier transform infrared spectroscopy analysis; a mechanical analysis; or a plasma atomic emission spectroscopic analysis.
    Type: Grant
    Filed: September 22, 2009
    Date of Patent: November 22, 2011
    Assignee: California Polytechnic Corporation
    Inventors: Keith Vorst, Greg Curtzwiler, Jeffrey Danes, Phil Costanzo
  • SYSTEMS AND METHODS FOR DETERMINING RECYCLED THERMOPLASTIC CONTENT
    Publication number: 20110068262
    Abstract: A system and method of identifying a reference standard library for thermoplastic content includes preparing a plurality of samples of each one of a plurality of known ratios of virgin thermoplastic/recycled thermoplastic, analyzing each of the plurality of samples of each one of the plurality of known ratios of virgin thermoplastic/recycled thermoplastic with at least one of a group of analyses consisting of: a differential scanning calorimetry analysis; a physical thickness analysis; an ultraviolet-visible spectroscopy analysis; an attenuated total reflectance Fourier transform infrared spectroscopy analysis; a mechanical analysis; or a plasma atomic emission spectroscopic analysis.
    Type: Application
    Filed: September 22, 2009
    Publication date: March 24, 2011
    Inventors: Keith Vorst, Greg Curtzwiler, Jeffrey Danes, Phil Costanzo